Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Measuring system and method for similar model displacement field based on grid lattice

A similar model and measurement system technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve problems such as changes, model surface cracks, and grid point damage, and achieve reliable extraction, good stability, and improved accuracy.

Active Publication Date: 2016-01-20
CHINA UNIV OF MINING & TECH (BEIJING)
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present invention aims to solve the problem that the automatic grid method needs manual intervention when the illumination changes, cracks appear on the model surface, and the grid points are damaged, etc., and provides a displacement field measurement system and method based on image recognition and computer vision technology. The system and method can still realize fully automatic measurement of the displacement field when the above situation occurs

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Measuring system and method for similar model displacement field based on grid lattice
  • Measuring system and method for similar model displacement field based on grid lattice
  • Measuring system and method for similar model displacement field based on grid lattice

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0017] Some specific examples are given below regarding the technical solution adopted by the present invention. It should be noted that the described examples are only intended to facilitate the understanding of the present invention, and do not limit it in any way.

[0018] Such as figure 1 Shown are the schematic diagrams of two embodiments of the grid points of the similar model displacement field measurement system of the present invention. figure 1 The shape of the grid points shown in a is a rectangle, figure 1 The shape of the grid point shown in b is circular, and there is an identity code "A21" on the grid point to identify its identity. The grid point can be made by printing the identity code on a piece of paper through a printer, and then fixing it on the grid by pasting. similar model surfaces. Grid point shapes except figure 1 a and figure 1 In addition to the rectangle and circle shown in b, any shape that can be automatically recognized by the computer can ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a similar model displacement field measurement system, comprising: an image acquisition device composed of a grid lattice arranged on the surface of a similar model, a camera array or a single camera with precise and controllable poses, a computer for data processing, and a network The grid points are marked with identity codes composed of numbers, letters and other symbols. Based on the measuring system of the present invention, the present invention also relates to the following measuring method: the image of the similar model surface is obtained by means of sub-area acquisition; the grid points are extracted based on their geometric shape; the geometric center of the grid points is used as the grid point The coordinates of the grid point; use the pose relationship between the camera coordinate system and the measurement coordinate system to transform the grid point coordinates into a unified coordinate system; identify the identity code in the grid point area, and use this as a basis for the grid point Matching; obtain the displacement field of a similar model by comparing the changes of grid point coordinates in the measurement coordinate system.

Description

Technical field [0001] The invention involves the field of similar model displacement field measurement and photography measurement. Specifically, it is a non -contact fully automatic measurement system and method that uses image processing technology to measure the displacement field on the surface of similar models. Background technique [0002] Similar model tests are one of the main technical means to study mine pressure and rock formation activities.Compared with theoretical analysis and numerical simulation methods, similar model tests can qualitatively or quantitatively reflect the stagnation characteristics of the rock layer, and can simulate the structure of underground engineering, geological structure, and rock formation relationships in a comprehensive simulation.Therefore, similar model tests can explore many problems that are not easy to solve in mathematics and mechanical methods. Large -scale application has been obtained in the fields of mineral resources mining,...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/02
Inventor 杨克虎杨胜利袁志宝
Owner CHINA UNIV OF MINING & TECH (BEIJING)
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com