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Microwave plasma based atmospheric pressure desorption ion source and application thereof

A microwave plasma and normal pressure desorption technology, applied in the direction of ion source/gun, particle separator tube parts, mass spectrometer, etc., to achieve the effect of fast analysis speed, easy disassembly and assembly, and simple operation

Active Publication Date: 2013-08-07
SICHUAN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although these ionization technologies have important applications in various fields, they all have certain limitations. Therefore, the development of new ion sources is of great significance to the development of atmospheric pressure mass spectrometry ionization technology.

Method used

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  • Microwave plasma based atmospheric pressure desorption ion source and application thereof
  • Microwave plasma based atmospheric pressure desorption ion source and application thereof
  • Microwave plasma based atmospheric pressure desorption ion source and application thereof

Examples

Experimental program
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Effect test

Embodiment 1

[0043] This embodiment is based on the atmospheric pressure desorption ion source of microwave plasma, and its structure is as attached figure 1 As shown, its composition includes a base part 4 designed with a cylindrical lumen, a main adjustment part 3 installed in the cylindrical lumen of the base part for the main regulation of microwave coupling, and a main adjustment part 3 installed in the main adjustment part lumen for microwave coupling. The micro-adjustment part 2 of the tube structure coupled with micro-adjustment, the gas discharge tube 1 installed in the lumen of the micro-adjustment part and the microwave antenna installed outside the gas discharge tube for applying microwave coupling to the discharge gas in the discharge tube. The cavity bottom 42 of the base member is formed by fixing an annular plate to the end surface of the cavity 41 of the base member through screws, and the bottom of the cavity is designed with a mounting hole for the gas discharge tube to ...

Embodiment 2

[0045] This embodiment is based on the atmospheric pressure desorption ion source of microwave plasma, and its structure is as attached figure 2 As shown, its composition includes a base part 4 designed with a cylindrical lumen, a main regulating part 3 installed in the cylindrical lumen of the base part for the main regulation of microwave coupling, and a gas discharge device installed in the lumen of the main regulating part. Tube 1 and a microwave antenna mounted outside the gas discharge tube for coupling microwaves to the discharge gas inside the discharge tube. The cavity bottom 42 of the base member is formed by fixing an annular plate to the end surface of the cavity 41 of the base member through screws, and the bottom of the cavity is designed with a mounting hole for the gas discharge tube to pass through. The main adjusting part is designed with an annular plug disc 34 that slides with the inner wall of the lumen of the base part, and its adjusting end is designed ...

Embodiment 3

[0047] Applying the microwave-induced plasma atmospheric desorption ion source of the present invention to analyze solid and liquid samples can adopt image 3 In the manner shown, the wave-induced plasma atmospheric pressure desorption ion source disclosed in Example 2 is placed on a vertical rotary table that can rotate in the vertical plane within the range of 0-90°, and the vertical rotary table is placed on a 3D ( Place the solid or liquid sample on the carrier plate on the translation stage. The material of the carrier plate for carrying the sample can be quartz sheet, HF corroded quartz sheet, ceramic sheet, stainless steel sheet, etc. Liquid samples can also be placed directly in the vessel. The horizontal distance between the sample and the entrance of the mass spectrometer is 5-20mm, and the vertical distance is 1-5mm. The angle between the plasma and the sample surface can be 0-90°, so that more sample ions to be tested can enter the mass spectrometer, improve the de...

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PUM

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Abstract

The invention discloses a microwave plasma based atmospheric pressure desorption ion source and application thereof. The ion source comprises a matrix part designed with a cylindrical tube cavity, a main regulating part of a tubular structure, a gas discharge tube and a microwave antenna, the main regulating part is mounted in the cylindrical tube cavity of the matrix part and used for regulating microwave coupling, the gas discharge tube is mounted in a tube cavity of the main regulating part, and the microwave antenna is mounted outside the gas discharge tube and used for applying microwave coupling to discharge gas inside the discharge tube. An ion source device of an atmospheric pressure desorption mass spectrometer is composed of the ion source and used for microwave plasma atmospheric pressure desorption mass spectrometry of to-be-tested samples, and the ion source has the extremely outstanding advantages of small needed power, small needed gas quantity, no need of toxic reagents, high plasma temperature, freeness of pollution to environment, easiness in operation, and the like.

Description

technical field [0001] The invention belongs to the technical field of atmospheric pressure mass spectrometry ionization, and in particular relates to a microwave plasma-based atmospheric pressure desorption ion source and its application. Background technique [0002] As a spectroscopic method, mass spectrometry has its significant advantages, that is, high sensitivity, fast analysis speed, good selectivity, and can be used for chemical measurement, etc. Therefore, mass spectrometry analysis methods are widely used in drug synthesis and analysis, forensic science, food safety, petroleum, etc. Chemical, environmental science and other fields. Regardless of molecular mass spectrometry or atomic mass spectrometry, the basic structure of the instrument is composed of a sampling system, an ion source, a mass analyzer, a detector, a vacuum system, a computer control system, and a data processing system. Among them, the ion source is directly related to the sensitivity and detect...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/10H01J49/26
Inventor 段忆翔詹雪芳李丹丹
Owner SICHUAN UNIV
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