Solar cell multifunctional contact resistance automatic measuring instrument and measuring system thereof

Abstract

The invention discloses a solar cell multifunctional contact resistance automatic measuring instrument which comprises a box body. A test probe, a camera and a sample stage which is used for placing solar cell samples to be measured are arranged inside the box body. The sample stage is located on the lower portion of the box body. Both the test probe and the camera are located above the sample stage. The camera is arranged on the periphery of the test probe to monitor a probe of the test probe. The sample stage and the test probe can be moved relatively to enable the probe of the test probe to aim at and contact grid lines of the solar cell samples to be measured. According to the solar cell multifunctional contact resistance automatic measuring instrument, the camera is used for monitoring the probe of the test probe, and the sample stage and the test probe can be moved relatively, and the probe is capable of being located quickly and accurately, and quickly and accurately measuring metal grid line contact resistances of solar cells and square resistances of silicon slices. The invention further relates to a measuring system which is formed by the solar cell multifunctional contact resistance automatic measuring instrument. The solar cell multifunctional contact resistance automatic measuring instrument and the measuring system are simple in structure, stable in operation, easy to achieve, convenient to use, high in test efficiency and suitable for application in the production line of measurement of solar cell contact resistances.

Description

technical field [0001] The present invention relates to the testing field of crystalline silicon solar cells, in particular to a solar cell multifunctional automatic contact resistance measuring instrument, and also relates to a measuring system composed of the measuring instrument, which can automatically measure solar cell surface grid wire contact resistance, square resistance and surface resistance. Scan and measure the sheet resistance and resistivity of the silicon wafer surface. Background technique [0002] The quality of the metal ohmic contact on the surface of crystalline silicon solar cells is reflected by the contact resistance. Contact resistance is an important aspect to consider in solar cell electrode optimization. The size of the contact resistance is not only related to the contact pattern, but also related to the diffusion process and contact formation process. The ohmic contact quality of different grid line patterns can be reflected by the size of the...

AI Technical Summary

Problems solved by technology

The measurement result of this method is more accurate, but the measurement process is more cumbersome and the measurement time is longer

However, using the Core Scan method requires the use of special testing instruments. The contact resistivity obtained by this test method is not accurate enough, and it can only be used for relative comparison and cannot be used as the real value of the battery surface contact resistivity.

In addition, there are other measurement methods that are less used, such as the circular transmission line method. This method has the disadvantages of requiring a special custom-made stencil and cannot directly measure the battery on the production line; in addition, there are There are two-point method, three-point contact method and four-point contact method, etc., the measurement results obtained by these methods are not accurate enough

[0004] In summary, due to the defects of long measurement time, low efficiency, and poor accuracy of the above measurement methods, and at the same time lack of a special test equipment for measuring the contact resistance of solar cells, it is not conducive to the measurement of contact resistance of solar cells on the production line. Applications

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