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Scanning sampling and image processing method of fast imaging

An image processing and image processing device technology, applied in the field of optical scanning, can solve the problems of weak image signal intensity, image detail distortion, short exposure time, etc., and achieve the effects of fast readout speed, low distortion, and high signal-to-noise ratio

Inactive Publication Date: 2013-06-26
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

However, due to the fast scanning imaging speed and short exposure time, under the same optical power, only the subarray (or ROI) working mode of the sCMOS camera is used for sampling imaging, and the obtained image of the entire sample has weak signal intensity and low contrast
The larger the N value of the number of pixel rows included in the sampling frame at the same time, the lower the sampling resolution, resulting in more serious image detail distortion.

Method used

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Embodiment Construction

[0024] In this specific embodiment, aiming at the high-speed imaging working mode of the new detection device sCMOS Flash2.8, a scanning sampling and image processing method based on image shift and superposition is firstly proposed to solve the problem of rapid continuous scanning and sampling of imaging objects based on platform movement. Problems with weak signal strength and low resolution in imaging.

[0025] Such as figure 1 The schematic diagram of the scanning sampling system is shown, and the imaging object is placed on the translation stage. During the scanning sampling process, the illumination beam and the detector sCMOS do not move, but the translation stage moves, and the moving speed is related to the frame rate of the detector and the sampling method. In the figure, 1 is a sCMOS camera, 2 is a lens, 4 is a half mirror, 5 is an objective lens, 6 is a platform on which a sample is placed, and 7 is a light source. The imaging object is placed on the mobile platf...

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Abstract

The invention discloses a scanning sampling and image processing method of fast imaging. A sCMOS (Complementary Metal-Oxide-Semiconductor) camera is adopted as an imaging tool, and is worked in a subarray (or ROI) mode, the method comprises the following steps: enabling an imaging object to continuously translate vertical to a sampling direction of the sCMOS camera with a set speed by using a moving plateform, performing scanning imaging on the object by using the sCMOS camera, and outputting sampling frames, shifting and overlying the obtained images to obtain an image. By adopting of the high-speed sampling feature of the sCMOS camera under the subarray (or ROI) mode, and shifting and overlying the sampling frames of the sCMOS camera, the generated image is high in resolution, high in signal to noise ratio and low in distortion, and the method is especially suitable for the fast imaging of the large-size object.

Description

technical field [0001] The invention relates to the field of optical scanning technology, in particular to a scanning sampling and image processing method for rapid imaging using scientific research-grade CMOS, that is, sCMOS. Background technique [0002] With the development of modern industry and technology, the demand for fast imaging is becoming stronger, especially for large-volume or large-area object imaging. For example, in biological research, understanding the structure of biological tissues and organs will greatly promote the grasp of their functions, and provide a strong scientific basis for the diagnosis of various functional diseases. However, due to the large size of tissues and organs (such as the brain) and the limited imaging range, multiple regional imaging is required to obtain a complete tissue structure data on a plane; at the same time, because of the specificity of organisms, imaging studies on a large number of samples are required to obtain Statis...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H04N5/225H04N5/232H04N5/243H04N23/76
Inventor 骆清铭曾绍群龚辉郑廷杨涛
Owner HUAZHONG UNIV OF SCI & TECH
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