Classification method aiming at small sample and high dimensional images
A classification method and small sample technology, applied in the fields of instruments, character and pattern recognition, computer parts, etc., can solve the problems of unsatisfactory high-dimensional image classification effect, difficult debugging and maintenance, complex input parameters, etc., and achieve great scientific research value. With the application value, easy to use and maintain, the effect of less input parameters
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[0032] The present invention will be further described below in conjunction with drawings and embodiments.
[0033] A classification method for small samples and high-dimensional images, refer to figure 1 , including the following steps:
[0034] (1) Obtain the first classification rule: select the image as the training set, and perform image feature extraction processing on the training set. The image features include shape features, color features, position features and centroid features, and then make the processed training set enter the first-level classification device to obtain the first classification rule, the first-level classifier is designed using a feature description method, the first classification rule adopts the understanding of the image type by expert experience decision-making, and expresses the image type through feature description decision-making, because many defects are processed Due to the process, the cause of formation is relatively fixed, or there ...
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