Classification method aiming at small sample and high dimensional images
A classification method and small-sample technology, applied in the direction of instruments, character and pattern recognition, computer components, etc., can solve problems such as unsatisfactory high-dimensional image classification effects, difficult debugging and maintenance, and affecting recognition effects, and achieve great scientific research value The effect of application value, ease of use and maintenance, and no impact on efficiency
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[0032] The present invention will be further described below in conjunction with drawings and embodiments.
[0033] A classification method for small samples and high-dimensional images, refer to figure 1 , including the following steps:
[0034] (1) Obtain the first classification rule: select the image as the training set, perform image feature extraction processing on the training set, the image features include shape feature, color feature, position feature and centroid feature, and then make the processed training set enter the first-level classification device to obtain the first classification rule, the first-level classifier is designed using a feature description method, the first classification rule adopts the understanding of the image type by expert experience decision-making, and expresses the image type through feature description decision-making, because many defects are processed Due to the process, the cause of formation is relatively fixed, or there is a cor...
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