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Double refraction realtime measuring device and method

A real-time measurement, birefringence technology, applied in measurement devices, instruments, scientific instruments, etc., can solve different problems that cannot measure the phase delay and fast axis azimuth of the sample to be measured in real time, and the measurement results are susceptible to fluctuations in the light intensity of the light source. Influence and other problems, to achieve the effect of simple structure of the measuring device

Inactive Publication Date: 2013-04-10
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

However, the device obtains different polarization states through the magneto-optical polarization rotator, and cannot measure the phase retardation and fast axis azimuth of the sample to be measured in real time.
At the same time, the measurement results of the device are easily affected by the fluctuation of the light intensity of the light source.

Method used

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  • Double refraction realtime measuring device and method
  • Double refraction realtime measuring device and method
  • Double refraction realtime measuring device and method

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Embodiment Construction

[0026] The present invention will be further described below in conjunction with the accompanying drawings and implementation examples, but the protection scope of the present invention should not be limited thereby.

[0027] see first figure 1 , figure 1 It is a structural block diagram of the birefringence real-time measurement device of the present invention. As can be seen from the figure, the birefringence real-time measurement device of the present invention is composed of a collimated light source 1, a circular polarizer 2, a beam splitter 4, a first Wollaston 5, a second Wollaston 6, a first double quadrant The detector 7, the second dual-quadrant detector 8 and the signal processing unit 9 are composed of the positional relationship: along the forward direction of the light beam of the collimated light source 1, passing through the circular polarizer 2 and the beam splitter in sequence 4. The beam splitter 4 divides the incident light beam into a transmitted sub-be...

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Abstract

The invention relates to a double refraction realtime measuring device and method. The device is characterized by comprising an alignment light source, a circular polarizer, a spectroscope, a first Wollaston prism, a second Wollaston prism, a first double quadrant detector, a second double quadrant detector and a signal processing unit. According to the device and the method, double refraction of a sample can be measured in real time, and the measurement result is not affected by light-intensity variation.

Description

technical field [0001] The invention relates to the technical field of polarization measurement, in particular to a real-time birefringence measurement device and method for samples. technical background [0002] Birefringence is an important characteristic of optical materials, and the parameters that characterize birefringence are mainly phase retardation and fast axis azimuth. In actual use, due to changes in the use environment, the phase retardation of the birefringent element will have a certain deviation from the nominal value, and usually the fast axis azimuth of the birefringent material is not marked, and it needs to be measured precisely during use The birefringence of birefringent materials. [0003] Prior art [1] (see Xiaojun Chen, Lianshan Yan, and X. Steve Yao. Waveplate analyzer using binary magneto-optic rotators. OPTICS EXPRESS. Vol.15, No. 20, 12989-12994, 2007) describes a magnetic A device for measuring wave plate phase retardation and fast axis azimut...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/23
Inventor 曾爱军刘龙海朱玲琳郑乐行黄惠杰
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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