Integrated circuit defect optical detection method and device
An integrated circuit, optical detection technology, applied in the direction of measuring devices, optics, optical components, etc., can solve the problems of enhancement, increase the error rate of defect detection, etc., and achieve the effect of high defect detection accuracy
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[0039]The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0040] In integrated circuits, circuit defects can affect or even destroy the normal function of the chip, directly leading to the failure of the device function. Therefore, the detection of defects in integrated circuits is very important in the manufacturing process of integrated circuits.
[0041] In the embodiment of the present invention, the spiral phase technology is applied to the detection of integrated circuit defects, and a spiral phase p...
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