Test system for central processing unit (CPU) module

Abstract

The invention relates to a test system for a central processing unit (CPU) module. The system comprises a computer test host and a test device of the CPU module, wherein the computer test host accesses a CPU state register on the to-be-tested CPU module and executes test programs due to the fact that a universal serial bus (USB) data line penetrates through the test device of the CPU module. The test device of the CPU module comprises a test interface of the CPU module, USB debugging sub-interface, a power control circuit, a USB main interface test circuit, an external expansion bus test circuit, an input / output (IO) test circuit, an Ethernet interface test circuit, and a clock backup power test circuit. The test system not only achieves a test for quality of the CPU module, but also can locate specific faulty lines and chips. By means of the power control circuit, delayed electrifying protection of the to-be-tested CUP module and a power short circuit test can be achieved, and therefore hot plugging in the test process is achieved. The whole test system is simple in structure and convenient to operate.

Description

technical field [0001] The invention relates to a test system for a CPU module, which belongs to the technical field of electronic product manufacturing. Background technique [0002] After the CPU module is welded on the board, a comprehensive test is required to ensure that the produced CPU module has no quality problems such as short circuit or open circuit. In the existing CPU module testing method, the function and performance test of the whole machine can only be performed after the CPU module to be tested is placed in the application device. If the whole machine fails, replace the CPU module and repair it, then confirm that the original CPU module is damaged. This test method has a complicated operation process, cannot directly locate specific fault lines on the CPU module, chip damage and other quality problems, and cannot perform targeted repairs on soldering problems, and the test efficiency is low. The current CPU functions are getting stronger and stronger, the...

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to provide a test system for the CPU module to solve the current problems such as the large number of CPU pins and complex lines, which lead to complicated test operation procedures and the inability to directly locate specific faulty lines on the CPU module.

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