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Method for determining multi-carrier micro-discharging secondary electron number

A secondary electron and multi-carrier technology, applied in the microwave field, can solve problems such as component overdesign

Active Publication Date: 2012-11-28
XIAN INSTITUE OF SPACE RADIO TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Research at home and abroad shows that there is a serious problem of component over-design based on the P20 theory, and the experimental verification is only to verify whether the single-carrier design is reasonable

Method used

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  • Method for determining multi-carrier micro-discharging secondary electron number
  • Method for determining multi-carrier micro-discharging secondary electron number
  • Method for determining multi-carrier micro-discharging secondary electron number

Examples

Experimental program
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Embodiment

[0035] (1) For such as figure 2The parallel plate structure with a thickness of 1mm shown is implemented with 5 carriers, the frequencies of the 5 carriers are f1=1GHz, f2=1.04GHz, f3=1.08GHz, f4=1.12GHz and f5=1.16GHz, and the carrier amplitude is a 1 =a 2 =a 3 =a 4 =a 5 =18V, the initial phases of the 5 carriers are where the minimum frequency f min =1GHz, the particle simulation (PIC Particle-in-cell) is carried out with single-carrier signals of different amplitudes as excitation signals, and the accumulated number of electrons under the excitation of single-carrier signals of different amplitudes is obtained. Simulation results such as image 3 shown.

[0036] (2) Mathematically process the number of electrons obtained in the first step to obtain the change trend of the number of electrons over time. The mathematical function here is specifically φ(F n ) = log10(F n ). like Figure 4 As shown, the electron accumulation rate and signal amplitude v can...

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Abstract

The invention provides a method for determining a multi-carrier micro-discharging secondary electron number. The method comprises the following steps of: firstly, taking single-path carrier signals which have different ranges and have the minimum frequency in multi-carrier signals to be analyzed as excitation signals; calculating a secondary electron number in a microwave part to be analyzed; carrying out mathematic treatment to obtain an electron accumulating speed curve under the effect of the different excitation signals; then, taking a signal between the two adjacent zero points of a multi-carrier synthesizing signal as a calculation subinterval; equalizing multi-carrier signals in each calculation subinterval into a single-carrier signal with the minimum frequency of the multi-carrier signals with the specific range; acquiring an electron accumulating speed corresponding to an equivalent single-carrier signal range through finding out an electron accumulating speed curve; accumulating an electron number generated by the effect of the multi-carrier signals between each two adjacent zero points to obtain the electron number when each calculation subinterval is finished; and counting the corresponding result to obtain the secondary electron number in the microwave part to be analyzed when the multi-carrier synthesizing signals of the different moments act.

Description

technical field [0001] The invention relates to the field of microwaves, and relates to a method for determining the number of secondary electrons of multi-carrier micro-discharge of microwave components. Background technique [0002] At present, most satellites work in the multi-carrier mode. The filter of the duplexer in the communication satellite transceiver system is a common channel for signal transmission and is in a high resonance state. There are problems in the analysis and design of micro-discharge under the excitation of multi-carrier signals. [0003] The most important difference between the multi-carrier microdischarge analysis and the single-carrier case is that the amplitude of the excitation signal is not constant, but changes rapidly with time depending on the initial phase. The number of electrons in space microwave components does not change monotonously with time, and the secondary electron accumulation curve is prone to large jitter, which seriously in...

Claims

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Application Information

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IPC IPC(8): H04L27/26H04L5/00
Inventor 王新波崔万照夏亚峰殷新社冉立新申建华
Owner XIAN INSTITUE OF SPACE RADIO TECH
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