Novel ion source for time-of-flight mass spectrometer

A technology of time-of-flight mass spectrometry and ion source, applied in the field of instrumentation, can solve the problems of difficult disassembly and cleaning, complicated structure of the external ion source, etc., and achieve the effects of simple structure, improved ionization efficiency, and improved collision efficiency.

Inactive Publication Date: 2012-11-21
ANHUI USTC JIANCHENG HAISHENG TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The external ion source is the place where carbonization and pollution are most likely to occur, so the external ion source must be easy to disassemble and clean. Many existing external ion sources have complex structures that are not easy to disassemble and clean, and many even require professionals to maintain them.

Method used

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  • Novel ion source for time-of-flight mass spectrometer
  • Novel ion source for time-of-flight mass spectrometer

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Embodiment Construction

[0009] attached figure 1 And attached figure 2 It is a schematic diagram of an external ion source for a time-of-flight mass spectrometer realized according to the invention. The gas sample inlet (1) (2) (3), the ionization chamber (4), the filament and the filament generate a narrow electron beam Slit (5), repulsion accelerating electrode (6), permanent magnet pole (7), extraction slit (8), external ion source heating rod (9), external ion source temperature probe (10), external ion source fixing rod (11)(12)(13)(14) composition. Starting from the gas sample inlet (1) and centered on the repulsion accelerating electrode (6), on the ionization chamber (4), arranged clockwise, the external ion source fixing rod (11), filament and Filament produces electron beam slit (5), external ion source fixing rod (12), external ion source heating rod (9), gas sampling port (2), gas sampling port (3), external ion source temperature probe ( 10), external ion source fixing rod (13), perm...

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Abstract

The invention relates to an external ion source for a time-of-flight mass spectrometer. The external ion source comprises a gas sample inlet, an ionization chamber, a filament, a slit, a repulsion electrode, a magnetic pole, an ion lead-out slit, a heating rod, a temperature probe and a fixing rod. An external ion source device disclosed by the invention takes the gas sample inlet as a starting point and the repulsion electrode as a circle center; the fixing rod, the filament, the slit, the temperature probe, the heating rod, a dual-gas sample inlet, the fixing rod and the magnetic pole are orderly arranged on the ionization chamber in a clockwise direction; the filament, the slit, the repulsion electrode and the magnetic pile are on the same axis; the ion lead-out slit is parallel to the axis, and the repulsion electrode is an ellipse repulsion electrode. Compared with the prior art, the time-of-flight mass spectrometer has the advantages of being simple in structure, compact in structure, light in weight, less in energy consumption, high in ionization rate and convenient to clean and maintain; a multi-channel gas sample inlet is convenient to carry out inner reaction of a plurality of gas ion sources; the ion sources are heated unilaterally, the energy consumption and deposited carbon are reduced, and the time-of-flight mass spectrometer is suitable for an online and portable time-of-flight mass spectrometer ion source.

Description

technical field [0001] The invention relates to an external ion source for a time-of-flight mass spectrometer, belonging to the technical field of instruments. technical background [0002] A time-of-flight mass spectrometer is mainly composed of an ion source, a time-of-flight detector, and corresponding calculation and measurement systems, while the ion source is composed of an external ion source for generating ions, and an internal ion source for transporting and focusing ions; The external ion source in the existing time-of-flight mass spectrometer is complex in design, difficult to process, and consumes a lot of power, which is not suitable for the use requirements of on-line and portable mass spectrometers. [0003] The ion source of a time-of-flight mass spectrometer mainly includes an external ion source and an internal ion source. The external ion source is where ions are generated, and the internal ion source is where ions are focused, stored, and transmitted. Th...

Claims

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Application Information

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IPC IPC(8): H01J49/16
Inventor 宗诚刚
Owner ANHUI USTC JIANCHENG HAISHENG TECH
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