Capacitive screen comprehensive testing circuit, testing method and output data switching algorithm of testing method

Abstract

The invention discloses a capacitive screen comprehensive testing circuit, a testing method and an output data switching algorithm of the testing method. The capacitive screen comprehensive testing circuit comprises a master control chip, a USB (Universal Serial Bus)-to-serial port chip, a dial switch and an adapter plate, wherein an output end of the master control chip is connected with a USB-to-serial communication chip and an input end of the dial switch respectively; the master control chip is connected with the capacitive touch screen through the adapter plate; an output end of the USB-to-serial communication chip is connected with an input end of a computer serial communication port; and the computer serial communication port is connected with testing software. A set of circuit board device is adopted, a software algorithm is designed in a firmware of CTP (Capacitive Touch Panel), and the two are matched for use, so that the CTPs of various different ports can be connected to perform various different kinds of data analysis test working by using only one set of circuit board device and only one firmware at a research, development and debugging stage, a production testing stage and a repair stage of the CTP.

Description

technical field [0001] The invention relates to a capacitive screen testing technology, in particular to a comprehensive testing circuit, a testing method and an output data switching algorithm in the process of R&D, production and repair of a capacitive screen. Background technique [0002] At present, the research and development of capacitive screens and the actual measurement methods in the production process are usually as follows: [0003] (1) During the research and development process: generally use the test box provided by the main control chip manufacturer to analyze the performance of the capacitive screen and debug the parameters. At this time, it is necessary to burn the control chip of the CTP (capacitive screen) to output each Sensor ( Sensitive element) Raw-data (original capacitance sensing value) data firmware. [0004] (2) In the production process: the function inspection of CTP's FPCA (flexible printed circuit board module) incoming material, the functi...

AI Technical Summary

Problems solved by technology

[0006] In this way, the firmware to be used in each link is different, and the test equipment required is also different, which increases costs, reduces efficiency, and is not conducive to cost control.

[0007] In the existing test method, the firmware used in each link is different, and the test equipment required is also different, which increases time cost, labor cost, and reduces production efficiency.

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