Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Information integration method of advanced metering infrastructure

An advanced measurement system and information integration technology, applied in transmission systems, electrical components, etc., can solve problems such as information islands, and achieve the effect of strong versatility and good flexibility

Active Publication Date: 2012-09-12
哈尔滨工大正元信息技术有限公司
View PDF3 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0011] The purpose of the present invention is to provide an information integration method that is easy to share the information of the advanced measurement system and facilitate the expansion and upgrading of the AMI system, so as to solve the "information island" problem of the advanced measurement system

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Information integration method of advanced metering infrastructure
  • Information integration method of advanced metering infrastructure
  • Information integration method of advanced metering infrastructure

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The following is a more detailed description of the above and other technical features of the present invention according to the accompanying drawings.

[0028] figure 2 The mapping model from the basic application requirements to the abstract application layer protocol and its establishment process are given. The abstract application layer protocol first serves to realize the basic application requirements, so it solves the mapping problem from the basic application requirements to the abstract application layer protocol. The basic application requirements of the AMI system are to specify which subsystems, how many subsystems need to exchange information, and what information to exchange; which measurement units, how many measurement units need to exchange information, what information to exchange, and so on. At the same time, in order to adapt the basic application requirements to the needs of abstract communication, an application rule is formulated, which expresse...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an information integration method of an advanced metering infrastructure, and the information integration method is implemented through the formulation of a protocol and two-layer mapping relations. The method includes formulating an abstract application layer protocol which is applicable to the advanced metering infrastructure and can both meet basic application requirements and be adapted to continuous development requirements of the field bus or communication technology; on the basis, establishing a mapping model of basic application requirements to the abstract application layer protocol, and illustrating a detailed formulation method of the abstract application layer protocol concretely; and establishing a mapping model between the abstract application layer protocol and a specific filed bus application layer protocol, and illustrating a concrete achieving method of the abstract application layer protocol and the specific field bus application layer protocol through a mapping example of the abstract application layer protocol and an Ethernet application layer protocol so as to be capable of using mainstream field bus applied by the advanced metering infrastructure.

Description

technical field [0001] The invention relates to a smart grid system, in particular to an information integration method for an advanced measurement system of the smart grid system. Background technique [0002] The smart grid has the characteristics of safety, reliability, cost-effectiveness, self-healing and self-adaptation, and can create a cleaner, more efficient, safer and more reliable power system. It is a new direction for the development of domestic and foreign power grids. By adopting a series of high-tech technologies, the smart grid can improve energy utilization efficiency and energy supply security to a new level, and reduce pollution and greenhouse gas emissions to an acceptable level for the environment. Smart grid research is committed to achieving the following goals: to achieve safe and stable operation of the power grid; to make effective use of distributed power; to improve the utilization of power grid assets; to improve the efficiency, reliability and p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H04L29/08H04L29/12
Inventor 佟为明金显吉陈培友王胤燊李中伟李凤阁林景波
Owner 哈尔滨工大正元信息技术有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com