Double stroke mechanism

Abstract

The invention discloses a double-stroke mechanism which comprises an upper module and a lower module, wherein the upper module comprises a plane seat and swinging blocks which are hinged with the plane seat and can swing; rollers are arranged at the other ends of the swinging blocks; springs are respectively arranged between the swinging blocks located at the both sides of a hinging shaft and the plane seat; the lower module comprises a fixing seat, and two parallel side boards mounted on the fixing seat; a positioning block is fixed on each side board; a space capable of containing the swinging blocks is formed between the two positioning blocks; each positioning block comprises three sequentially-intersecting faces in the circumference direction; the intersecting faces are an upper inclined face located on the upper face, a concave arc face located on the lower face, and a lower inclined face; and the roller which slides into the concave arc faces along the upper inclined faces can be clamped through the concave arc faces. The roller on the upper module is clamped in the concave arc faces in the positioning blocks, so that a stopping position in the midway of a control stroke can be accurately controlled. The double-stroke mechanism provides double strokes for an ICT (In-Circuit Test), so that two probes with different lengths on the same probe board can be respectively tested, and the test accuracy is not influenced.

Description

technical field [0001] The invention relates to a double-stroke mechanism, which belongs to the technical field of machinery. Background technique [0002] Online test ICT (In-Circuit Test) is a standard test method to check the manufacturing defects and defective components by testing the electrical properties and electrical connections of online components. It has the advantages of simple operation, fast speed, and accurate fault location features. During ICT testing, it is necessary to test many devices and connecting lines in a circuit board, usually requiring multiple single-stroke needle boards. If probes with different lengths are set on the same needle board, the long probe is first in contact with part of the circuit or device to be tested and tested, and then the short probe is in contact with another part of the circuit or device to be tested for testing. Then it is difficult to control the motion stroke of the needle board. If the motion stroke is inaccurate, t...

AI Technical Summary

Problems solved by technology

If probes with different lengths are set on the same needle board, the long probe is first in contact with part of the circuit or device to be tested and tested, and then the short probe is in contact with another part of the circuit or device to be tested for testing. It is not easy to control the motion stroke of the needle board. If the motion stroke is inaccurate, the short probe may also come into contact with the circuit or device during the long probe test, which will affect the test accuracy.

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