Solar battery and component testing system based on Lab VIEW

Abstract

The invention discloses a solar battery and a component testing system based on Lab VIEW, which includes a data acquisition card, wherein the data acquisition card is connected with a sampling resistance, one end of the sampling resistance is respectively connected with one port of analog output ports of the data acquisition card and one port of analog input ports of the data acquisition card, the other end of the sampling resistance is connected with another port of input ports of the data acquisition card; another two analog input ports of the data acquisition card are connected with two ends of a sunload sensor; and after an installation of a drive program, the data acquisition card is connected with a computer test platform through a universal serial bus (USB) interface. The testing system is capable of transforming data at actual measurement environment into data on a standard condition so as to obtain a complete solar battery I-V characteristic curve, and then a requirement of field test is met.

Description

technical field [0001] The invention relates to a semiconductor material testing system, in particular to a solar cell and component testing system based on LabVIEW. Background technique [0002] Solar power generation has become one of the important aspects of the new energy industry. The solar cell is the most important device to realize photoelectric conversion, and its performance directly affects the efficiency of the solar power generation system. Therefore, the quality inspection of solar cells is particularly important. It is necessary to establish a set that can measure the open circuit voltage, short circuit current and maximum power point of solar cells and components in a short period of time, and can automatically draw its I-V characteristic curve and An automated test system that calculates parameters such as fill factor that characterize the performance of solar cells. However, the following problems exist in the solar cell test systems currently used in dom...

AI Technical Summary

Problems solved by technology

However, there are the following problems in the solar cell test systems currently used in domestic and foreign markets: 1) directly connect the solar cell to the load resistor, and obtain the I-V characteristics of the solar cell by changing the resistance value of the load resistor

However, there is internal resistance in the actual circuit, so that the solar cell cannot reach a complete short circuit state, so the test system cannot obtain a complete solar cell I-V characteristic curve

2) When a variable power resistor is used as the load of the solar cell, each measurement of the I-V characteristic curve of the solar cell requires manual adjustment of the resistance value many times, resulting in very limited measurement data points, and high human error factors, time-consuming strenuous

As a result, the hardware structure of the system is very complicated, the cost is high, the volume and quality are huge, and it cannot meet the needs of field test conditions

4) The test system cannot realize the conversion of solar cell performance under various test environments (ambient temperature, light intensity), so the volt-ampere characteristics of the solar cell to be tested can only be tested under standard test conditions, which cannot meet the on-site test in any test environment conditions; so that the test system should also include a light source device under simulated standard conditions. This simulated light source will not only cause a mismatch between the spectrum and other parameters and the real standard light source, but also increase the cost.

5) Due to the limitations of the data acquisition unit itself, the resolution of the measurement points in the volt-ampere characteristic curve of the solar cell is low and the interval is large, resulting in low test accuracy

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