Automatic test system for single event effect test of DC/DC (direct current/direct current) converter and test method

Abstract

The invention discloses an automatic test system for a single event effect test of a DC / DC (direct current / direct current) converter. The automatic test system comprises a programmable power supply, a PXI integrated sampling control unit which is connected with an electrical parameter signal control terminal box, an upper PC (personal computer) which is connected with the PXI integrated sampling control unit, and a LabVIEW test software for monitoring an electrical parameter signal and analyzing and processing the electrical parameter signal. The invention also discloses a test method for the automatic test system. By the automatic test system and the test method, the single event effect test data of the DC / DC converter can be tested fully automatically, automatic high-speed data acquisition, automatic product selection, automatic product loading, automatic power setting, test parameter setting, real-time acquired data display and data replay are integrated, the single event effect test efficiency of the DC / DC converter is greatly improved, and the damage to the body of a tester who enters a radiation room repeatedly during the test can be avoided.

Description

technical field [0001] The invention relates to an automatic test device system for DC / DC converter single-event effect test, which belongs to the technical field of space environment anti-radiation test and is used for fast and efficient DC / DC converter single-event test automatic test. Background technique [0002] With the rapid development of my country's aerospace industry, there is an urgent need for DC / DC converters with high performance, high reliability, miniaturization and resistance to space radiation. In the anti-radiation DC / DC converter project, it is necessary to study key technologies for space environment tests using anti-radiation DC / DC converters in aerospace and weapon systems. To carry out the research and development of radiation-resistant DC / DC converters, it is necessary to carry out research on the space orbit simulation environment test of the product, conduct ground simulation test verification on the space environment resistance of aerospace produ...

AI Technical Summary

Problems solved by technology

At present, there are mainly the following two schemes for the testing device for DC / DC converter single event effect test: one is to use only the oscilloscope to set the threshold value of high and low levels to perform a single trigger to capture the single event effect test phenomenon, or use the oscilloscope to Install the plug-in to achieve multiple trigger acquisition, but the disadvantage of this method is that the number of trigger settings and the sampling rate are contradictory, that is, as the number of multiple trigger settings increases, the sampling rate decreases.

In addition, the trigger level can only be set to a high or low level, and the thresholds of high and low levels cannot be set at the same time. During the single event test, the amplitude of the jump of the output voltage may be high or low; the second is to use the integrated data recorder Although the test data can be recorded, the sampling rate is less than 1MS / s, which cannot meet the high-speed acquisition requirements of the DC / DC converter single event effect test.

In addition, in the above two schemes, the test personnel have to enter the irradiation room many times to manually switch products and power on and load during the test, which is inefficient and causes certain harm to the test personnel's body.

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