Thin film transistor-liquid crystal display (TFT-LCD) electrical problem testing circuit and testing method

Abstract

The embodiment of the invention discloses a thin film transistor-liquid crystal display (TFT-LCD) electrical problem testing circuit and a testing method, which relate to the field of liquid crystal displays and can effectively distinguish capacitive and TFT problems. The TFT-LCD electrical problem testing circuit comprises a testing device, which is connected with the input ends of first reference voltage and second reference voltage corresponding to the same gray level. The testing device controls the output ends of the first reference voltage and the second reference voltage to output constant voltage to a data line. The TFT-LCD electrical problem testing circuit and the testing method are used for the liquid crystal displays.

Description

Technical field [0001] The invention relates to the field of Thin Film Transistor-Liquid Crystal Display (TFT-LCD for short), in particular to a TFT-LCD electrical failure test circuit and test method. Background technique [0002] In the flat panel display technology, TFT-LCD has the characteristics of small size, low power consumption, no radiation, and relatively low manufacturing cost, and it occupies a dominant position in the current flat panel display market. [0003] With the continuous expansion of liquid crystal display (Liquid Crystal Display, abbreviated as LCD) production, product performance has also been continuously improved. Among them, product defect detection plays a pivotal role in the entire production process. [0004] In the TFT-LCD inspection process, the DC / DC (DC to DC power supply) test method can effectively distinguish electrical and optical defects, which can greatly reduce the positioning range of the defects in the front-end project, and quickly find t...

AI Technical Summary

Problems solved by technology

[0005] However, it is known that a display screen is caused by electrical defects, how to distinguish whether it is capacitive or TFT-related, there is no good way in mass production testing.

At present, the detection method of the box is the same as the detection method and mechanism of the terminal. Although it can detect various optical and electrical defects of the liquid crystal display, it cannot be detected under the premise that it is caused by the electrical defect. It is very good to distinguish whether it is capacitive or TFT-related, especially some defects such as uneven light and dark traces (Mura), which cannot be distinguished in time when they occur on a large scale, which leads to slow positioning of defects, which leads to Big loss

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