SRAM type fpga single event effect test system and method

Abstract

The invention provides a test system and method for a single event effect of an SRAM (System Random Access Memory) type FPGA (Field Programmable Gate Array). The test system comprises a single chip microcomputer processor, an RS232 interface circuit, a USB (Universal Serial Bus) interface circuit, a test FPGA and a storage unit. The test system and method can be used for fault injection tests of a configuration memory and a BRAM (Battery Random Access Memory) of the SRAM type FPGA, and single event function interrupting detection, single event locking detection and single event turning detection including single event turning detection for a configuration storage region, the BRAM and a trigger of the SRAM type FPGA are realized. The invention has the advantages of simplicity in operation, entirety in detection, high accuracy, good real-time property and strong universality.

Description

technical field [0001] The invention relates to a SRAM type FPGA single event effect test system and method. Background technique [0002] FPGA is a new type of reconfigurable device. The use of FPGA in satellite development can speed up the development progress of satellites, shorten the development cycle, and improve the performance of satellites. The satellite works in the space radiation environment, and the radiation effect will cause the FPGA performance to degrade or even fail, and the FPGA performance degradation caused by the single event radiation effect is particularly obvious. Before the satellite uses FPGA, single event effect detection must be carried out on FPGA, and the sensitivity of single event effect can be evaluated through the test, so as to provide a basis for the model selection of devices and systems for radiation-resistant hardening design. [0003] Domestic single-event experiments are mainly concentrated on various traditional fixed-function devi...

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Problems solved by technology

The fault injection system and method of Beijing Times Minxin Technology Co., Ltd. needs to make faulty unit modules, modify the gate-level HDL code of the target circuit, and generate faulty circuits. The operation requires high professional ability and the process is complicated

[0006] Foreign reports engaged in single event effect test research mainly include the American XILINX company and the European SAAB laboratory. The software and IP core can comprehensively complete the single event effect detection and fault injection of the internal resources of the FPGA under test, but the internal resource detection technology of the FPGA used in the test has not been disclosed, and a large number of technologies cannot be obtained in China, and the detection method is to use The FPGA under test is configured as a fixed logic function, and the external computer uses special software to detect the general internal resources of the device. The detection scheme does not target the specific application logic of the device; the European SAAB laboratory also cooperates with Xilinx, and adopts a specially designed detection Board, host computer detection software and IP core for single event effect detection and fault injection, the technical details of the detection are not disclosed and cannot be obtained domestically

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