Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Motherboard multi-hard disk port testing system and method

一种端口测试、多硬盘的技术，应用在错误检测/纠正、仪器、电数字数据处理等方向，能够解决成本和时间浪费、硬盘体积大不便维护、硬盘价格高等问题，达到节约成本和时间的效果

Inactive Publication Date: 2011-12-07
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF6 Cites 12 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

If each hard disk port uses a hard disk as a test device, firstly, the price of the hard disk is generally high, secondly, the hard disk as a test device is bulky and inconvenient to maintain, thirdly, the loss is large, and fourthly, the hard disk is easily affected by vibration and affects the test effect
At the same time, if the testers test the ports one by one, they need to re-plug the hard disk after each port is tested, and restart the test program, which will cause cost and time waste in large-scale production applications

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Motherboard multi-hard disk port testing system and method
  • Motherboard multi-hard disk port testing system and method
  • Motherboard multi-hard disk port testing system and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0011] Such as figure 1 As shown, it is a structure diagram of a preferred embodiment of the motherboard multi-hard disk port testing system of the present invention. The motherboard multi-hard disk port testing system 10 runs on a host computer 1 , and the motherboard 11 to be tested in the host computer 1 is connected to the testing device 2 . The test device 2 includes a MUX chip 21, a storage device 22, an I / O port 25, an I / O port conversion module 24, an indicating device 23 and a SATA / SAS port group containing at least one SATA / SAS port 20. The indicating device 23 is driven by the MUX chip 21 . Wherein, each port in the SATA / SAS port group 20 has a corresponding number according to the order of arrangement, and in the figure, 6 ports are taken as an example; the number of channels of the MUX chip 21 can be customized according to the number of ports that actually need to be tested, and The chip channels are also numbered according to the order in which they are arran...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A mainboard multi-hard disk port testing system, which includes: a switching channel module, which is used to switch the channel of the MUX chip connected to the port to be tested and connect to the storage device to form a data transmission path from the mainboard to be tested to the storage device; verification data module, when the storage device is connected to the MUX chip, the verification data is written into the storage device through the above data transmission path; the verification data module is used to write the verification data from the storage device through the above data transmission path The written verification data is read; the verification module is used to verify whether the written and read verification data are consistent; the sending module is used to send the information that the port currently being tested is normal or abnormal to the MUX chip; erase data The module is used for erasing the verification data written in the storage device when the port currently being tested is normal. The invention also provides a testing method for multiple hard disk ports on the main board. The invention can automatically test all the hard disk ports of the motherboard at one time.

Description

technical field [0001] The invention relates to a system and a method for testing ports of hard disks on a mainboard, in particular to a system and a method for testing ports of multiple hard disks on a mainboard. Background technique [0002] After the main board is assembled, it needs to go through a comprehensive functional test, including testing the various ports on the main board. At present, there are generally multiple SATA / SAS (SATA: SerialAdvanced Technology Attachment, serial advanced technology attachment, SAS: SerialAttached SCSI, serial connection SCSI interface) hard disk ports on the motherboard, after expansion by PCI-E (PCI Express) expansion card There are even dozens of ports, and the network storage device has more hard disk ports. The general way to test these ports is that testers connect all hard drive ports to hard drives for functional testing. If each hard disk port uses a hard disk as a test device, firstly, the price of the hard disk is general...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/267
CPCG06F11/2221
Inventor 胡明祥欧阳铭修陈军民曾革新彭爽
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com