Method for visually and intelligently identifying internal defects of GIS (Geographic Information System) equipment
A technology of internal defect and intelligent identification, applied in the direction of material analysis using radiation, can solve problems such as difficult to predict, fall off, identify nature and position, and achieve the effect of improving scientificity
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] The method for visual intelligent identification of internal defects of GIS equipment according to the present invention will be described in detail below in conjunction with the accompanying drawings.
[0031] The flow of the method of visual intelligent identification of internal defects of GIS equipment is as follows: figure 1 shown. The method comprises the steps of:
[0032] A. Detection of partial discharge source on GIS equipment;
[0033] B. Perform spectral feature extraction on the detected partial discharge source data;
[0034] C. Use the X-ray digital imaging detection system to visually image the area of the partial discharge source and form an X-ray transillumination picture;
[0035] D. Carry out feature extraction from the X-ray transillumination pictures obtained by the X-ray digital imaging detection system;
[0036] E. Retrieve the similarity between the spectral features of the obtained partial discharge source data and the features of the X-r...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com