Characteristic testing system of semiconductor laser

Abstract

The invention discloses a characteristic testing system of a semiconductor laser, comprising a semiconductor laser driver, three-dimensional parallel guide rails, a laser temperature control module, an LIV (power-current-voltage) and spectrum test module, a polarization test module, a near-field light spot test module, a near-field nonlinear test module, a far-field test module, a space spectrum test module and a center software processing module. Working modules can be selected according to needs simultaneously. The characteristic testing system is used for high-accuracy and automation test of the semiconductor laser, especially for a high-power semiconductor laser, so that the cost for detection and manufacture of the semiconductor laser is reduced.

Description

technical field [0001] The invention belongs to the technical field of semiconductor lasers, and relates to characteristic testing of semiconductor lasers, in particular to a semiconductor laser characteristic testing system. Background technique [0002] Semiconductor lasers have the advantages of small size, light weight, high electro-optical conversion efficiency, stable performance, high reliability and long life. And input and output equipment), film and television, manufacturing, aerospace, aviation, material processing, medical treatment, entertainment, scientific research, security protection, military, anti-terrorism, handicrafts, display and printing industries. Testing and characterization of the performance parameters of semiconductor lasers is the key to a deep understanding of the characteristics of the laser, and it is also an important basis for judging whether the laser is good or bad; only in this way can the laser be used correctly and its life extended. ...

AI Technical Summary

Problems solved by technology

[0006] (1) Single function: Foreign semiconductor laser test systems still do not have the functions of polarization test, near-field nonlinear test and spatial spectrum test

However, the domestic semiconductor laser test system only has the functions of LIV test and spectrum test.

[0007] (2) Low test power: Most of the semiconductor laser performance parameter test systems are mainly for testing semiconductor lasers within 100W, and the maximum test power only stays at the kilowatt level.

[0008] (3) Single LIV test mode: LIV test is mainly divided into CW (continuous wave output) mode test and QCW (quasi continuous wave output) mode test. For most test instruments, two test functions cannot be realized at the same time

[0009] (4) There are few types of semiconductor lasers to be tested: there are many types of semiconductor lasers. Most of the current testing instruments can only test one or several specific types of semiconductor lasers, but cannot test other types of semiconductor lasers. Therefore, The types of semiconductor lasers tested are few

[0010] (5) Low degree of automation and precision: At present, foreign semiconductor laser testing instruments have realized automation and high-precision testing, but domestic testing instruments have not yet fully realized automated testing, and the accuracy is limited

[0011] (6) High cost: Although foreign semiconductor laser testing instruments can realize automatic and high-precision testing, their cost is so high that the price is expensive

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