Flip performance testing system of electronic device

Abstract

The invention discloses a flip performance testing system of an electronic device which is used for testing the flip performance of the flip type electronic device comprising a main body and a cover body, wherein the flip performance testing system of the electronic device comprises a supporting mechanism, a rotating mechanism, a sensing device, a driving device and a controlling device; the supporting mechanism is used for supporting the electronic device and locating the main body; the controlling device is used for controlling the driving device to drive the rotating mechanism to rotate the cover body to a preset critical angle; the cover body is automatically opened till the cover body is in contact with the sensing device and is exerted with pressure; the sensing device is used for converting the pressure into an electric signal and transmitting to the controlling device; and the controlling device analyzes the signal to judge whether the flip performance of the electronic device is normal.

Description

technical field [0001] The invention relates to an electronic device testing system, in particular to a system for testing the flip performance of flip-type electronic devices. Background technique [0002] With the rapid development of wireless communication technology and information processing technology and the improvement of people's living standards, mobile phones, personal digital assistants (personal digital assistant, PDA) and other electronic devices are emerging and entering thousands of households, so that consumers can With the convenience brought by high technology anywhere, these portable wireless communication devices have become an indispensable part of modern people's daily life. [0003] Most of these electronic devices are clamshell-type electronic devices, which generally include a body, a cover, and a hinge device, and the cover and the body are rotatably mounted together through the hinge device. Among them, when one type of clamshell electronic devic...

AI Technical Summary

Problems solved by technology

However, the existing flip performance flip testing system usually needs to manually turn over the cover of the electronic device, so it is only suitable for testing the flip performance of the first type of flip electronic device.

When testing the flip performance of the second type of flip electronic device, it is difficult to manually flip the lid to a predetermined critical angle to test its automatic flip performance. Generally, the lid can only be judged by visual inspection and hand feeling. Flip angle flip performance, testing is more inconvenient, and error-prone, very low efficiency

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