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Testing system and method of high-voltage processing plate of thyristor

A high-voltage processing and testing system technology, applied in electronic circuit testing, circuit breaker testing, measuring devices, etc., can solve problems such as inability to function test, and achieve the effect of improving stability and reliability

Inactive Publication Date: 2013-01-30
XJ ELECTRIC +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a testing system and method for a thyristor high-voltage processing board, so as to solve the problem that the complete functional testing of each unit of the TE board cannot be performed on site

Method used

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  • Testing system and method of high-voltage processing plate of thyristor
  • Testing system and method of high-voltage processing plate of thyristor
  • Testing system and method of high-voltage processing plate of thyristor

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Embodiment Construction

[0033] The present invention will be described in further detail below in conjunction with the accompanying drawings.

[0034] The system embodiment of the present invention is as follows:

[0035] Such as figure 2 A thyristor TE board test system shown, including a thyristor for corresponding connection with the thyristor TE board V , a controller B1 , and a high voltage test circuit;

[0036] a thyristor V , whose cathode K ,anode A , the gate are respectively connected to the corresponding ports of the high-voltage processing board, and the cathode K ground; anode A RC energy terminal with TE board RC- The RC series branch and the third relay are arranged in series in sequence K3 The normally open contact of the gate; the trigger output corresponding to the gate and the TE board G+ A fourth relay is provided in series between K4 The normally open contact;

[0037] Such as image 3 As shown, a controller B1 , including a processor unit...

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Abstract

The invention relates to a testing system and method of a high-voltage processing plate of a thyristor, which is used for solving the problem that an integral function test can not be carried out on each unit of a TE (Tangent Elevation) plate on the spot. The testing system provided by the invention can detect each functional module of the TE plate and judges whether each function of the TE plate is correct or not. The testing method provided by the invention comprises a power supply test, a gate pole triggering test, a negative rechecking signal test, a low-voltage triggering test and a high-voltage triggering (BOD (Biochemical Oxygen Demand) protection triggering) test of the TE plate. The invention provides a convenient, reliable and comprehensive testing method and enhances the operating stability of the TE plate after installation, thereby enhancing the operating reliability of the whole system.

Description

Technical field [0001] The present invention involves a test method of a high -voltage processing board (referred to as TE board) that involves a high -voltage processing board (referred to as the TE board), and the test system that adopts this method. Background technique [0002] In the high -voltage rectifier equipment and mid -high -voltage static non -effective power compensation SVC, the high -voltage crystal tube is widely used.For the trigger and state detection of high -pressure crystal tubes, the current common practice at home and abroad is to implement a TE board on each level of the gates of each level, so as to meet the system's trigger, protection and state monitoring function of the system. [0003] The high potential board TE board of the crystal tube is connected to the two ends of the crystal tube. The energy required for the work of its own work is obtained through the RC damping circuit of the crystal tube, completing the trigger of the crystal tube, trigger ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/28G01R19/165G01R31/327
Inventor 姚为正张建胡四全董朝阳景兆杰王林魏卓吉攀攀
Owner XJ ELECTRIC
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