Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and device for simulating logic hard disk test by using bad sector log sheet

A technology for simulating testing and bad sectors, applied in digital recording/reproducing, digital signal error detection/correction, etc., can solve problems such as hard disk damage, and achieve the effect of improving test speed

Inactive Publication Date: 2011-05-04
INVENTEC CORP
View PDF1 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The purpose of the present invention is to solve the technical problem that the hard disk is easily damaged when testing and reading the logical hard disk in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for simulating logic hard disk test by using bad sector log sheet
  • Method and device for simulating logic hard disk test by using bad sector log sheet
  • Method and device for simulating logic hard disk test by using bad sector log sheet

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0019] The detailed structure of the present invention and its connections are described below in conjunction with the following drawings.

[0020] see figure 2 As shown, it is a functional block diagram of the simulated test hard disk of the present invention, which includes: an option ROM 21, which receives and executes an entity request instruction; a bad sector record table 22, which is set in the option ROM 21 Among them, execute the entity request instruction of this option ROM 21, provide bad sector setting information to this option ROM 21, this bad sector setting information includes a hard disk serial number 221, magnetic sector and block 222, block The data of the count value 223; a hard disk firmware 23, outside the bad sector setting information range, provides a hard disk data read and write instruction to read and write the hard disk 24, and the hard disk 24 should be the bad sector writing position originally, Directly use a simulated bad sector to write the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method and device for simulating a logic hard disk test by using a bad sector log sheet. The device comprises an option read only memory, the bad sector log sheet and a hard disk firmware, wherein the option read only memory is used for receiving and executing an entity requirement command; the bad sector log sheet is arranged in the option read only memory, and is used for executing the entity requirement command in the option read only memory and providing bad sector set information for the option read only memory; and the hard disk firmware is arranged out of the range of the set information of a bad sector and is used for providing a hard disk data reading and writing command to read and write the hard disk. When the bad sector log sheet is utilized to stimulate the data in the block of the bad sector, no data are necessary to be written in the hard disk and a real block of the bad sector is also not necessary to be manufactured, thereby improving the test speed of a logic disk.

Description

technical field [0001] The invention relates to a method and device for simulating and testing a logical hard disk by using a bad sector record table. Background technique [0002] When we are testing to read the logical hard disk, we often need to use the command Mark Bad Sector to mark a block (Block) of a certain hard disk as "bad", and then test the reading logic Hard disk fault tolerance mechanism (Error Handling). But this command can only be executed for "a certain" block, so if there are many blocks that need to be marked as broken, many commands will need to be executed. [0003] see figure 1 As shown, it is a functional block diagram of a conventional simulated test hard disk, wherein an optional read-only memory 11 receives and executes an entity request command, enters a hard disk 13 through a hard disk firmware (HDD Firmware) 12, and performs marking of bad sectors zone operation, and generate a bad sector writing position 131, but once it is marked as bad, t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G11B20/18
Inventor 陈重江
Owner INVENTEC CORP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com