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Method for predicting life of solid tantalum electrolytic capacitor

A tantalum electrolytic capacitor and life prediction technology, which is applied in the direction of instruments, measuring electronics, measuring devices, etc., can solve the problems of long test time, difficulty in obtaining life data, high cost, etc., and achieve the effect of shortening test time and saving test cost

Inactive Publication Date: 2011-04-27
BEIHANG UNIV
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Problems solved by technology

[0007] Compared with ordinary capacitors, due to the characteristics of high reliability, long life, and soft failure of tantalum capacitors, it is difficult to obtain its life data in a short period of time. Traditional life test methods face difficulties such as long test time and high cost.

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  • Method for predicting life of solid tantalum electrolytic capacitor
  • Method for predicting life of solid tantalum electrolytic capacitor
  • Method for predicting life of solid tantalum electrolytic capacitor

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Embodiment Construction

[0040] The present invention will be further described in detail below in conjunction with the accompanying drawings and Embodiment 1.

[0041] The present invention is a method for predicting the life of a tantalum capacitor based on leakage current degradation. Before the method is executed, the following assumptions are first made:

[0042] Hypothesis 1: The degradation of tantalum capacitors is irreversible;

[0043] Hypothesis 2: The degradation of the performance of the tantalum capacitor specimen before the accelerated degradation test is negligible;

[0044] Assumption 3: An accelerated degradation model corresponds to a degradation process, mechanism or failure mode;

[0045] Assumption 4: The failure (degradation) mechanism at high stress levels is consistent with the failure (degradation) mechanism at design or normal service stresses.

[0046] And assume that the constant stress accelerated degradation life test is carried out on n tantalum capacitors, and there ar...

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Abstract

The invention relates to a method for predicting the life of a solid tantalum electrolytic capacitor, which comprises the following steps of: 1, collecting current degradation data; 2, determining a degradation track model and a degradation accelerating model; 3, extrapolating the degradation track model to obtain the pseudo-failure life of each sample; 4, performing hypothesis test of pseudo-life distribution and the estimation of unknown parameters; 5, determining the relation of population parameters of the pseudo-life distribution and a stress level; 6 estimating the population parameters of the life distribution of a tantalum capacitor under the normal stress by extrapolating; and 7, determining the average life and reliability curve of the tantalum capacitor. The method has novel concept and simple programs and does not need life tests, the test time can be shorted, the test cost can be saved, and the problem of disharmony between the prediction of the conventional life and engineering is solved, so the method has wide application prospect in the technical field of life prediction.

Description

(1) Technical field [0001] The invention relates to a life prediction method for a solid tantalum electrolytic capacitor, which belongs to the technical field of life prediction. (2) Background technology [0002] Solid tantalum electrolytic capacitors (hereinafter referred to as tantalum capacitors) are widely used in aerospace, aerospace and other fields due to their small size, large capacity, small leakage current, low loss, high reliability, and self-healing properties. , It mainly plays the role of power filter, decoupling, coupling and resonance in electronic products. The failure of tantalum capacitors will lead to a rapid decline in the reliability of the entire system, or even failure, so it is particularly important to scientifically evaluate and predict its life. [0003] With the advancement and development of science and technology, the reliability of tantalum capacitors has been greatly improved. In the timed censored life test, there will often be no failure...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R31/02
Inventor 高成黄姣英付桂翠梅亮
Owner BEIHANG UNIV
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