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Apparatus for characteristic inspection and sorting of electronic component

A technology for electronic components and classification devices, which is applied in the field of electronic component characteristic inspection and classification devices, can solve problems such as scale expansion, and achieve the effect of high-speed processing

Active Publication Date: 2011-03-30
HUMO LAB
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This not only leads to an increase in the scale of devices such as the preparation of multiple disks and multiple sets of drive mechanisms, but also requires a corresponding cost burden.

Method used

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  • Apparatus for characteristic inspection and sorting of electronic component
  • Apparatus for characteristic inspection and sorting of electronic component
  • Apparatus for characteristic inspection and sorting of electronic component

Examples

Experimental program
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Embodiment Construction

[0018] Before describing the invention, refer to figure 1 , figure 2 The device to be compared will be described. The device to be compared is a system that inspects one electronic component one by one using a disc for transporting one electronic component. figure 1 It is a layout diagram showing an electronic component characteristic inspection and sorting device of a typical design based on the premise of processing electronic components one by one in the prior art. figure 2 is as figure 1 A specific example of the transport disk of the device of the present invention shows a plan view of a disk having 50 divided openings (pockets).

[0019] like figure 2 As shown, the disk 2 has 50 openings 202 for accommodating electronic components, and the openings 202 are arranged on the outer periphery of the disk 2 on the center line 201 that divides the disk 2 into 50 parts. In devices using disc 2 figure 1 Among them, one electronic component 1 is supplied to the opening 20...

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PUM

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Abstract

An apparatus for characterizing inspection and sorting of an electronic component, supplies electronic components to a rotary disk in pair and in sequence, and holds and conveys the electronic components to detect, and sorts the electronic components based on detection result. The apparatus comprises: the disk having an opening set and capable of holding and conveying the electronic components in an opening unit or an opening pair unit; a disk drive mechanism for rotatingly driving the disk in the opening pair unit; an electronic component supply part for supplying electronic components to the opening set in the opening pair unit; an inspection part composed of an inspection unit set having electrode units corresponding to pair of the electronic components to obtain inspection data of each electronic component; a sorting device for sorting the electronic components according to a sorting result of inspection data sorting electronic components; and a control device configured to drive in a manner that two electronic components are supplied to the disk simultaneously to inspect, to obtain the inspection data through the inspection part, and to make the sorting device to sort based on sorting of inspection result.

Description

technical field [0001] The present invention relates to an electronic component characteristic inspection and sorting device that conveys, inspects and sorts a plurality of electronic components in parallel. In detail, it relates to an electronic component characteristic inspection and classification device as follows: a plurality of electronic components can be simultaneously supplied to a rotating disk for conveyance, and the electrical characteristics of the electronic components sequentially conveyed by the disk are inspected. Classify electronic components. Background technique [0002] In a conventional apparatus for inspecting and sorting the electrical characteristics of electronic components, a system in which electronic components are supplied and transported one by one to a rotating disk accommodating electronic components and inspected one by one is generally used (Patent Document 1) . [0003] Patent Document 1: Japanese Patent Laid-Open No. 2002-043194 [00...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R1/02B07C5/344
CPCB07C5/344G01R31/18G01R31/26H05K13/02
Inventor 中村正孝
Owner HUMO LAB
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