Device and method for measuring diffusion velocity of electronic wave packet

A technology of electron wave packets and diffusion speed, which is applied to devices using optical methods, etc., can solve the problems of reduced recombination rate of electrons and ions, and reduced harmonic efficiency

Inactive Publication Date: 2011-02-16
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

Under the action of a strong laser field with elliptically polarized polarization, when the electrons undergoing tunnel ionization travel in the light field for a period of time and return, they will deviate laterally relative to the parent ion, resulting in a decrease in the recombination rate of electrons and ions, and a significant decrease in harmonic efficiency (see Literature P.Dietrich, N.H.Burnett, M.Ivanov, and P.B.Corkum, Phys.Rev.A Vol.50, R3585, 1994)

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  • Device and method for measuring diffusion velocity of electronic wave packet
  • Device and method for measuring diffusion velocity of electronic wave packet
  • Device and method for measuring diffusion velocity of electronic wave packet

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Embodiment Construction

[0037] The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

[0038] see first figure 1 , figure 1 It is a schematic diagram of the optical path of a specific embodiment of the measuring device for the electron wave packet diffusion velocity of the present invention. As can be seen from the figure, the measuring device of the electronic wave packet diffusion velocity of the present invention has a structure comprising a chirped pulse laser system 1 and an optical parametric amplifier 2, and the optical parametric amplifier 2 output by the chirped pulse laser system 1 or its pumping A quarter-wave plate 5, a plano-convex lens 6, a high-order harmonic target chamber 7, and a soft X-ray grating spectrometer 8 are sequentially arranged on the optical path of the femtosecond laser 4, and the output wavelength of the chirped pulse struct...

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Abstract

The invention discloses a device and a method for measuring the diffusion velocity of an electronic wave packet and aims at measuring a higher harmonic spectrum, screening the relationship between the elliptic polarization independence for exciting the wavelength of laser generated by the high harmonic spectrum and the wavelength of the laser and calculating the speed of the electronic wave packet and the sizes of the electric wave packets corresponding to different laser wavelengths according to the relationship between the sensitivity to the laser elliptic polarization degree and the electronic wave packet kinetic process. The measuring device and the measuring method have the characteristics of simpleness and effectiveness and important significance on understanding the evolution of the electronic wave packets in the strong-field physics and the electronic micro kinetics.

Description

technical field [0001] The invention relates to strong-field laser physics, in particular to a measuring device and method for electron wave packet diffusion velocity, which is of great significance for understanding the evolution of electron wave packets in strong-field physics and the microscopic dynamics of electrons. Background technique [0002] Since the first ruby ​​laser came out in 1960, as a light source with high brightness, high coherence and high collimation, laser has provided a powerful tool for people's daily life and scientific research. In the following decades, laser technology has made great progress. The emergence of pulsed lasers has provided people with laser light sources with higher intensity and shorter time-resolution scales, thus promoting the field of strong field, microscopic ultrafast field, biology and so on. Rapid progress in the field of research. The output pulse width of pulsed laser light sources is getting narrower and narrower, from th...

Claims

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Application Information

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IPC IPC(8): G01P3/36
Inventor 姚金平俆晗熊辉付玉喜曾斌储蔚程亚俆至展
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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