Online detection fault-tolerance system of FPGA (Field programmable Gate Array) digital sequential circuit of SRAM (Static Random Access Memory) type and method

Abstract

The invention discloses an online detection fault-tolerance system of an FPGA (Field programmable Gate Array) digital sequential circuit of an SRAM (Static Random Access Memory) type and a method. The method comprises the following steps of: respectively dividing the sequential circuit for detection and fault-tolerance into combinational logics and sequential logics; respectively carrying out triplication redundancy and majority voting to the combinational logics and the sequential logics to cover failures and obtain a redundant sequential circuit, dividing the redundant sequential circuit inthe physical structure into three independent dynamic reconstruction regions and a static region and macro-processing the communication between the dynamic reconstruction regions and the static region with a bus; and respectively physically restraining the three redundant combinational logics to the three independent dynamic reconstruction regions and physically restraining the three redundant sequential logics to the static region. Compared with the prior art, the invention combines two-stage redundancy and reconfiguration technologies, not only can improve the system reliability, but also can reduce implementation resources and decrease the power consumption of a designed circuit.

Description

technical field [0001] The invention belongs to the field of fault diagnosis of integrated circuits, and in particular relates to an on-line fault-tolerant system and method for SRAM type FPGA digital sequential circuits. Background technique [0002] Today's electronic systems increasingly use programmable devices, especially Field Programmable Gate Array (FPGA) devices. SRAM FPGA supports multiple reconfiguration programming, has abundant resources and superior performance, and is widely used in signal processing, communication, control and other fields. The digital sequential circuit based on SRAM type FPGA is also widely used in the fields of information processing and control. However, as the integration level and operating frequency become higher and higher, the process size becomes smaller and smaller, and the supply voltage becomes lower and lower, the noise margin of the device is reduced, and crosstalk or internal noise sources can also cause transients. Fault. ...

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Problems solved by technology

This three-mode redundancy method can greatly improve the reliability of the system, but this method has the disadvantage of occupying more resources and making the circuit power consumption larger

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