Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method for measuring delay of direct sequence spread spectrum binary phase shift keying modulator

A binary phase shift keying and direct-sequence spread spectrum technology, which is applied in transmission monitoring, electrical components, transmission systems, etc., can solve the problem of difficulty in accurately measuring the delay of direct-sequence spread spectrum binary phase shift keying modulators, etc.

Inactive Publication Date: 2013-06-05
中国航天科工集团第二研究院二〇三所
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a method for measuring the time delay of a direct sequence spread spectrum binary phase shift keying modulator to solve the problem that the existing conventional technology is difficult to accurately measure the time delay of a direct sequence spread spectrum binary phase shift keying modulator

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for measuring delay of direct sequence spread spectrum binary phase shift keying modulator
  • Method for measuring delay of direct sequence spread spectrum binary phase shift keying modulator
  • Method for measuring delay of direct sequence spread spectrum binary phase shift keying modulator

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0043] The specific steps of a method for measuring the delay of a direct sequence spread spectrum binary phase shift keying modulator are:

[0044] The first step is to set up a time delay measurement system, which includes: baseband signal generator 1, power divider 2, tested direct sequence spread spectrum binary phase shift keying modulator 3, high-speed data collector 4 , Demodulation module 5, despreading module 6, delay related module 7, cable A8, cable B9, and cable C10.

[0045] Among them, the baseband signal generator 1 is connected to the power divider 2, and one way of the power divider 2 is connected to the high-speed data collector 4 through the cable A8. The other channel of the power divider 2 is connected to the tested direct sequence spread spectrum binary phase shift keying modulator 3 through the cable B9, and the output port of the tested direct sequence spread spectrum binary phase shift keying modulator 3 is connected with the cable C10 The high-speed data ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a method for measuring delay of a direct sequence spread spectrum binary phase shift keying modulator. Data despreading and demodulation and delay dependence are taken as cores, the delay measurement of input / output signals with different frequencies and different waveforms of the direct sequence spread spectrum binary phase shift keying modulator is converted into the delay measurement of signals with the same frequency and the same waveform, and is implemented by a created system. Digital signals are divided into two paths by a baseband signal generator (1) through apower divider (2), one path of digital signals pass through a direct sequence spread spectrum binary phase shift keying modulator (3) to be tested and enter a high-speed data acquisition unit (4), and the other path of digital signals are directly output by the power divider (2) to the high-speed data acquisition unit (4). A demodulation module (5) and a dispreading module (6) respectively perform demodulation and despreading processing on the acquired signals, and a delay-dependent module (7) calculates the delay of the two paths of signals. The method ensures that additional delay caused byhardware is not introduced in the measuring process, and can ensure the delay measuring accuracy less than 500ps when the sampling rate is 4GSa / s.

Description

Technical field [0001] The invention relates to a method for measuring the delay of a spread spectrum modulator, in particular to a method for measuring the delay of a direct sequence spread spectrum binary phase shift keying modulator. Background technique [0002] With the rapid development of science and technology, the requirements for the accuracy of distance measurement in the fields of satellite positioning, satellite navigation, aerospace ranging, etc. are getting higher and higher. The key to accurate distance measurement is accurate measurement of time delay. In modern communication systems, in order to achieve the purposes of anti-noise, anti-interference, and secure communication, modems with complex modulation systems are usually used in transceivers. As a part of the communication link, the time delay component of the modulator has a certain influence on the final measurement result. Only by accurately measuring this part of the time delay can the accuracy of positi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H04B17/00H04B1/707H04B1/7075H04B1/7095H04B17/309
Inventor 陈婷张国华成俊杰张娜
Owner 中国航天科工集团第二研究院二〇三所
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products