Method and system for parallel testing

Abstract

The invention discloses a method for parallel testing, which comprises the step of: adopting a time division duplex parallel testing mechanism to perform the parallel test on at least two of an uplinkreceiver index, a downlink emitter index and a functional index. The invention also discloses a system for the parallel testing, which comprises a testing unit used for adopting the time division duplex parallel testing mechanism to perform the parallel test on the at least two of the uplink receiver index, the downlink emitter index and the functional index. The method and the system in the invention can improve the utilization ratio of channel resources, the testing efficiency and the testing accuracy.

Description

technical field [0001] The invention relates to parallel test technology, in particular to a method and system for parallel test of uplink and downlink indicators based on TD-SCDMA system time division duplex characteristics. Background technique [0002] At present, the existing TD-SCDMA system whole machine test scheme is to test the base station whole machine test items. The base station machine test items include transmitter indicators, receiver indicators and functional indicators of the base station. Among them, the transmitter index and receiver index are determined according to the test items and test items shown in Table 1 below, and the functional index is determined by the design or manufacturer according to the product characteristics. [0003] [0004] Table 1 [0005] As far as the existing TD-SCDMA system test plan is concerned, compared with the test plan of the WCDMA system, the test plan of the existing TD-SCDMA system for the test items of the base st...

AI Technical Summary

Problems solved by technology

[0016] First, the test efficiency is low, especially not conducive to the needs and guarantee of mass production testing

Since all test items are sequentially tested one by one, the test time is equal to the sum of all test items, resulting in a long test time and restricting the addition of new test items, which is not conducive to improving the coverage of the test

[0017] In the second aspect, the advantages of time division multiplexing of physical channels of the TD-SCDMA system cannot be fully utilized, so that the technical advantages of TD-SCDMA cannot be reflected in the test

[0018] The third aspect is not conducive to improving the accuracy of the receiver index test

Based on the existing test process, in order to make the test time the shortest, it can only be carried out by reducing the time of each test item, which is not conducive to the accuracy measurement of the test items, especially to improve the accuracy of the receiver index test, such as receiving The test of machine sensitivity is that the longer the statistical time, the more accurate

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