Check system, check method, CT apparatus and detection device

A technology for inspection systems and detection devices, applied in the field of inspection systems, can solve problems such as high cost of detectors, impracticality, and increased number of rows

Active Publication Date: 2009-05-06
TSINGHUA UNIV +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, due to the high cost of detectors, it is not realistic to increase the number of rows significantly

Method used

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  • Check system, check method, CT apparatus and detection device
  • Check system, check method, CT apparatus and detection device
  • Check system, check method, CT apparatus and detection device

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Embodiment Construction

[0026] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like elements throughout. The embodiments are described below in order to explain the present invention by referring to the figures.

[0027] Such as figure 1 and 2 As shown in , the inspection system according to the present invention includes: a CT device, the CT device includes: a slip ring, a radiation source connected to the slip ring, a detection device opposite to the radiation source and connected to the slip ring; The conveying device, wherein the detection device includes N rows of detectors, and there is a predetermined interval between two adjacent rows of detectors, wherein N is an integer greater than 1.

[0028] In one embodiment of the present invention, the inspection system may further include a scanning imaging device for obtaining a two-dimensional image, and the CT device and t...

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Abstract

The invention provides an inspection system which comprises a CT (Computed Tomography) device. The CT device comprises a slip ring, a ray source connected with the slip ring, a detection device and a conveyor, wherein the detection device corresponds to the ray source and is connected with the slip ring, and the conveyor conveys objects to be detected; the detection device comprises N rows of detectors, a preset gap is formed between adjacent two rows of detectors, and N is an integer larger than 1. The inspection system of the invention can be adopted to realize the high-speed scanning imaging of the CT device, enables the simultaneous use of the CT device and a scanning imaging device used for obtaining two-dimensional images to be possible so as to compensate for the mutual shortcomings.

Description

technical field [0001] The invention relates to an inspection system, an inspection method, a CT device and a detection device. Background technique [0002] In order to solve the scanning speed problem of the CT device, a conventional method is to use multiple rows of detectors, so that multiple rows of data can be collected at the same time each time, such as patent application WO2005 / 119297. However, due to the high cost of detectors, it is not realistic to increase the number of rows significantly. Contents of the invention [0003] The present invention proposes an inspection system, an inspection method, a CT device, and a detection device, wherein the detection device can effectively reduce the number of detector rows while increasing the effective detection area of ​​the detection device, thereby reducing the cost of the detection device. [0004] According to one aspect of the present invention, the present invention proposes an inspection system, which includes:...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/04G01V5/00
CPCG01N2223/501G01N23/046G01V5/005G01N2223/419G01N2223/612G01V5/0008
Inventor 张丽陈志强胡海峰李元景刘以农孙尚民张文宇邢宇翔
Owner TSINGHUA UNIV
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