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Method for determining the surface quality of a support and machine for transforming the associated support

一种表面质量、加工机的技术,应用在确定基片的表面质量领域,能够解决效率降低等问题

Active Publication Date: 2009-03-25
BOBST SA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The use of such devices can only prevent loss of efficiency by limiting the number of press stoppages

Method used

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  • Method for determining the surface quality of a support and machine for transforming the associated support
  • Method for determining the surface quality of a support and machine for transforming the associated support
  • Method for determining the surface quality of a support and machine for transforming the associated support

Examples

Experimental program
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Embodiment Construction

[0051] As shown in FIGS. 1 and 2 , the packaging is produced on a packaging line 1 . The production starts from an initial continuous substrate, ie a raw web 2 such as cardboard, and goes through various successive stages, which will be generally described below. The packaging line 1 is used to manufacture boxes 3 which can be folded and glued to form packages.

[0052] In a first stage, the coil 4 of the raw coil 2 is unrolled by means of a coil uncoiler 6 holding the coil 4 . The feed station 7 can then adjust the tension in the raw web 2 and advance the raw web 2 to a processing machine, described here as a printing press 8 in this example. The advancing direction of the raw web 2 (arrow F in FIGS. 1 to 3 ) forms the upstream and downstream directions.

[0053] In a second stage, the raw web 2 is printed and then allowed to dry as it passes through the printing press 8 . The web 2 passes successively through a plurality of printing units 9 , in this case six, in order to...

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PUM

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Abstract

A method for determining the surface quality of a substrate passing from an initial state into a converted state during a conversion process including the steps of acquiring first information relating to surface defects detected on the initial substrate, acquiring second information relating to surface defects detected on the converted substrate, of processing the first information and the second information, and of classifying the converted substrate as a function of the first acquired information relating to the surface defects detected on the initial substrate and as a function of the second acquired information relating to the surface defects detected on the converted substrate.

Description

technical field [0001] The invention relates to a method for determining the surface quality of a substrate. The substrate is transformed from an initial state to a processed state. The invention also relates to a substrate processing machine for processing a starting substrate and obtaining a processed substrate. The substrate processor is part of a packaging line. Background technique [0002] In the packaging industry, production lines convey processed products resulting from an initial substrate introduced at the beginning. The substrate may be a raw substrate. Usually, the raw initial substrate is subjected to processing, such as printing in a printing process, or to embossing, creases and / or cutting operations, so that when the substrate is unfolded, a blank or box corresponding to the package is obtained. [0003] An initial substrate in reel form subjected to processing may have previously been subjected to one or more previous treatments and then reprocessed, fo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/95B31B1/74
CPCG01N21/89D01G31/00B41F23/00
Inventor C·托马J·埃罗恩索
Owner BOBST SA
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