Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Examination-data processing apparatus and examination system

A technology for inspection data and processing devices, which is applied in data processing applications, electrical digital data processing, special data processing applications, etc., and can solve problems such as difficult display of inspection data and large energy consumption

Inactive Publication Date: 2008-12-10
KK TOSHIBA +1
View PDF1 Cites 21 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In addition, in the conventional technology, when performing continuous inspections such as dynamic image photography and multiple wave imaging inspections, the inspection results can only be displayed in time series, and it is difficult to selectively display inspection data at desired timings.
For example, in cardiovascular examinations, it is sometimes important to observe the examination data at the execution timing of desired events such as administration of drugs, dilation of stenosis by balloon catheters or stents, but in conventional techniques, in order to display It takes a lot of energy to expect various inspection data at regular intervals

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Examination-data processing apparatus and examination system
  • Examination-data processing apparatus and examination system
  • Examination-data processing apparatus and examination system

Examples

Experimental program
Comparison scheme
Effect test

Deformed example 1

[0201] In the time-series display screen 100 shown in FIG. 5 , it is possible to designate a desired examination displayed on the examination time column, and selectively display only the examination data of the specified examination.

[0202] For example, by designating an event of the treatment item "ev-c" and clicking "XA" and "polygraphy" in the check bar with the mouse, only the X-ray image and polygraphy corresponding to the event can be displayed. In addition, the designation method of the inspection is not limited to this. For example, it can be configured to specify the examination time 121 or the like, or it can be configured to use a pull-down menu in which a plurality of examinations can be specified and presented.

[0203] In this way, the time-series display screen 100 presents the inspection contents of each inspection device 1 together with the treatment items. Furthermore, when the examination content is specified through the operation unit 14, the workstatio...

Deformed example 2

[0206] In this modified example, an inspection system having a system configuration different from that of the above-described embodiment will be described. 8 and 9 show the configuration of an inspection system according to this modified example. In addition, in FIG.8 and FIG.9, the same code|symbol is attached|subjected to the same component as FIG.1 and FIG.2.

[0207] The inspection system of this modification is the same as the above-mentioned embodiment, and includes inspection devices 1 ( 1A to 1D ), a time server 2 , an inspection data server 3 , an inspection database 4 , and a workstation 10 .

[0208] In this modified example, each inspection device 1 and the time server 2 need not be connected through a communication line. In addition, in this modified example, each inspection device 1 is communicably connected to a workstation 10 .

[0209] In addition, the time server 2 of this modified example does not need to have the time difference calculation unit 23 . In...

Deformed example 3

[0227] During examinations or surgeries, procedural marks are sometimes generated by hand and then entered into a computer. In this case, for example, a plurality of inspection data can be reproduced synchronously using the same configuration as that of the above-mentioned embodiment or Modification 2.

[0228] Hereinafter, specific examples thereof will be described with reference to the configuration of the above-described embodiment (FIG. 1 and FIG. 2).

[0229] First, refer to Figure 11 An example of the state of use when acquiring inspection data and the like will be described. Cardiovascular examination is started (S61). When performing treatment on the patient, the nurse or the like writes down the treatment item and the treatment time by hand on a predetermined paper or the like (S62). In addition, the treatment time is recorded with reference to, for example, a clock installed in the examination room.

[0230] In addition, a doctor or the like conducts an inspect...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides an examination data processing apparatus and examination system reproducing a plurality of examination data acquired by examination synchronously in an easy way. An examination system comprises an examination apparatus (1) and a workstation (10). The examination apparatus (1) executes an examination on a patient to acquire a plurality of examination data and acquire an examination time of each examination data. The workstation (10) creates a procedure log that associates a procedure item executed on the patient with a procedure time thereof. The workstation (10) displays a chronological display screen (100) on a display (13) based on the procedure log and an examination time. An operator operates an operation part (14) to designate a procedure item in the chronological display screen (100). The workstation (10) extracts partial data within a range that corresponds to the designated procedure item from each of the examination data based on the examination time and the procedure log, and synchronizes and displays the extracted partial data on the display (13).

Description

technical field [0001] The present invention relates to an examination data processing device for processing data acquired in an examination in the medical field, and an examination system for performing an examination in the medical field. In particular, the invention relates to techniques used when performing multiple examinations in parallel. Background technique [0002] In the medical field, a plurality of examinations may be performed in parallel. For example, in cardiovascular examinations, X-ray contrast examination, IVUS (interventional ultrasonic: intravascular ultrasonography), polygraph examination (hemodynamic examination), electrocardiogram examination (ECG), etc. may be performed in parallel. . In addition, during surgery, patient imaging, electrocardiogram examination, blood pressure examination, etc. may be performed in parallel. [0003] Conventionally, data (examination data) acquired through a plurality of examinations have been individually processed ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): A61B19/00G06F19/00G09G5/00A61B6/00A61B8/00A61B5/0402A61B5/00
CPCA61B6/507G06Q10/06G16H10/60G16H15/00G16H30/40G16H40/20
Inventor 大关毅增泽高
Owner KK TOSHIBA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com