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Conductive rubber having conducting wire evagination for test

A conductive rubber and wire technology, applied in the direction of measuring electricity, measuring electrical variables, measuring devices, etc., can solve the problems of inability to conduct tests or tests, failures, and reduced test pass rates, and achieve the effect of improving test pass rates.

Active Publication Date: 2008-08-27
ADVANCED SEMICON ENG INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, the conventional conductive rubber 10 cannot be fully contacted with the package body 20 to be tested and the test instrument (or test board) accurately, which will lead to a reduction in the test pass rate.
[0005] Furthermore, refer to figure 2 As shown, the large-sized package to be tested 30 generally has a shape that is high in the middle and low around, so that the solder balls 31, 32 in the middle part of the large-sized package to be tested 30 cannot be electrically connected to the wires of the conventional conductive rubber 10. connection, will result in the test being impossible or failing

Method used

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  • Conductive rubber having conducting wire evagination for test
  • Conductive rubber having conducting wire evagination for test
  • Conductive rubber having conducting wire evagination for test

Examples

Experimental program
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Embodiment Construction

[0013] see image 3 , which shows a schematic diagram of the conductive rubber according to the first embodiment of the present invention. The conductive rubber 40 of the first embodiment of the present invention includes a rubber body 41 and several wires 42 , 43 . The rubber body 41 has a first surface 411 and a second surface 412 , and the second surface 412 is opposite to the first surface 411 . The conductive wires 42, 43 are arranged in the rubber body 41 and run through the first surface 411 and the second surface 412. The ends of the conductive wires 42, 43 protrude from at least the first surface 411 or the second surface 412. one of them.

[0014] That is, one of the ends of the wires 42, 43 protrudes from the first surface 411, or the other end of the wires 42, 43 protrudes from the second surface 412, or in this embodiment, the wires Both end points of 42 and 43 protrude from the first surface 411 and the second surface 412 .

[0015] The conductive rubber 40 i...

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PUM

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Abstract

The invention relates to an electroconductive rubber for test, wires of which extend outward, comprising a rubber body and a plurality of wires, wherein the rubber body is provided with a first surface and a second surface corresponding to the first surface; wires arranged in the rubber body pass through the first surface and the second surface; end points of wires extend out of at least one surface of the first surface and the second surface. The invention is provided with wires which extend outward, which makes wires and a packaging body to be tested or a testing apparatus(or a testing plate) in complete electric connection, thus the testing qualification rate can be improved.

Description

technical field [0001] The invention relates to a conductive rubber, in particular, to a conductive rubber for testing with protruding wires. Background technique [0002] refer to figure 1 As shown, a conventional conductive rubber (Surface Mount Matrix, SMM) 10 used for testing includes a rubber body 11 and several wires 12, 13 and so on. The rubber body 11 has a first surface 111 and a second surface 112 . The wires 12, 13 are arranged in the rubber body 11, pass through the first surface 111 and the second surface 112, and expose the wires 12, 13 on the first surface 111 and the second surface 112. end points, and these end points are coplanar with the first surface 111 and the second surface 112 . [0003] The conductive rubber 10 is used to connect a package to be tested 20 and a test instrument or a test board (load board) (not shown), the package to be tested 20 is arranged on the first surface 111 side, the test instrument Or the test board is disposed on the si...

Claims

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Application Information

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IPC IPC(8): G01R1/06G01R1/073
Inventor 庄庆文张修明叶金宝黄俊源詹家华黎光恒洪宏庆
Owner ADVANCED SEMICON ENG INC
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