Universal test supporting plate for solving problem of high false test rate caused by pin bending
A general-purpose testing and bending technology, applied in the direction of electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problems of test needles being bent, unable to meet production requirements, and offset.
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[0017] The following will clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0018] see Figure 1 to Figure 2 , the embodiment of the present invention includes:
[0019] A general-purpose test carrier board that solves the problem of high mismeasurement rate caused by glue bending, including a board body 1, T-shaped stepped holes 11 are arranged at the four corners of the board body, and the inner side of the T-shaped stepped hole 11 Both are provided with circular holes 12 , the T-shaped stepped holes 11 are used for fixing the plate body 1 , and the circular holes 12 are arranged along th...
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