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LED parameter test method

A parametric testing and parameter technology, applied in the testing of optical performance, single semiconductor device testing, etc., can solve the problem of long measurement cycle of LED light decay characteristics, and achieve the effect of reliable test data, simple operation and continuous testing.

Inactive Publication Date: 2010-02-24
HANGZHOU ZHONGWEI PHOTOELECTRIC TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The measurement cycle of LED light decay characteristics is very long (tens of thousands or even tens of thousands of hours)

Method used

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  • LED parameter test method

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Experimental program
Comparison scheme
Effect test

Embodiment

[0071] Below are different test objects, the numerical value measured by the method of the present invention:

[0072]

[0073] Dominant wavelength(nm)

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Abstract

The invention relates to a photoelectric testing technology, in particular to a method for testing LED parameters. The method controls a whole operation process mainly through a PC, wherein the PC transmits a preset polarity parameter and an electric testing parameter to a PCI control module, and a light test parameter to a light test module, while the PCI control module transmits corresponding parameter signal to a polarity detection module and an electric test module; moreover, a fixture is started to carry out parameter testing, and then the data tested by the fixture is transmitted to thePC. The method has the advantages that: the entire method has convenient testing, simple operation and reliable testing data; moreover, a testing device designed according to the method can realize continuous testing of a plurality of performances. The method can be widely used in enterprises for LED production and research and development, etc.

Description

technical field [0001] The invention relates to an optical and electrical testing technology, in particular to a testing method for LED parameters. technical background [0002] Semiconductor light-emitting diodes (LEDs) have been widely used in indicator lights, signal lights, instrument displays, mobile phone backlights, vehicle light sources, etc. White LED technology is also developing continuously, and LEDs are more and more widely used in the field of lighting. In the past, there were no more comprehensive national standards and industry standards for LED testing. In production practice, only relative parameters were used as the basis. Different manufacturers, users, and research institutions had great disputes over this, which led to the development of the domestic LED industry being greatly affected. big impact. [0003] In order to seize the commanding heights of LED research, developed countries in the world have invested a lot of manpower and material resources i...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26G01M11/02
Inventor 张九六
Owner HANGZHOU ZHONGWEI PHOTOELECTRIC TECH CO LTD
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