Method and system for performing components fault problem close loop analysis

Abstract

A method and system for performing component fault problem close loop analysis are provided. The system establishes a component failure physics fault tree, converts the failure physics fault tree into a failure locating fault tree, establishes, a component fault dictionary with failure mechanism cause corresponding to failure characteristics and performs fault problem close loop analysis to the component according to the fault tree and the fault dictionary. By the method and system of the present disclosure, it is possible to locate the component fault in the internal physical structure by the failure locating fault tree, to give a clear failure path, to quickly identify the failure mechanism corresponding to the component failure mode by analysis of failure feature vector of the fault dictionary, and to determine the mechanism factors and influencing factors of relevant failure mechanism by the failure physics fault tree. Thus, targeted failure control measures are proposed to achieve fast and accurate locating and diagnosis to the electronic component failure.

Description

FIELD OF THE INVENTION[0001]The present disclosure relates generally to the field of fault diagnosis, and more particularly to a method and system for performing component fault problem close loop analysis.BACKGROUND OF THE INVENTION[0002]The aim of component fault problem close loop analysis is to locate failure and determine the failure mechanism by FTA and failure analysis, to propose improvements according to the cause of failure, and thus to achieve the fault problem close loop, that is, meeting the requirements of “accurate locating, clear mechanism, and effective measures” to the fault. To achieve component fault problem close loop, a variety of techniques are used. However, most of the existing techniques of component failure analysis are those of failure phenomenon observation, which lack of analysis technology to the failure information, and the resulted fault problem close loop conclusion are related to one's analysis experience. Thus, the key to fault problem close loop ...

AI Technical Summary

Benefits of technology

The present patent provides a method and system for performing close loop analysis of component faults to quickly and accurately locate and diagnose electronic component failures. The system uses a failure locating fault tree, analysis of failure feature vectors, and failure physics fault trees to identify the failure mechanism and determine the factors that influenced it. This allows for targeted failure control measures to be proposed and implemented. Overall, the method and system provide a fast and accurate way to diagnose and address electronic component failures.

Problems solved by technology

However, most of the existing techniques of component failure analysis are those of failure phenomenon observation, which lack of analysis technology to the failure information, and the resulted fault problem close loop conclusion are related to one's analysis experience.

But for electronic components, the general fault diagnosis and fault problem close loop analysis using fault tree and fault dictionary method cannot accurately perform fault locating and diagnosis due to the diversity of the failure modes and the complexity of the failure mechanism of electronic components.

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