Semiconductor circuit device and a system for testing a semiconductor apparatus

Abstract

The present invention relates to a semiconductor circuit device for testing a semiconductor device, comprising at least one test data generating device; at least one test clock input for receiving a test clock signal and receiving at least one test data signal relative to a test clock signal; at least one first adjustable writing delay device for adjusting the relative time relation between the test data signal and the test clock signal; at least one test data output connected to the semiconductor device under test; at least one test data clock output connected to the semiconductor device under test for emitting a test data clock signal to the semiconductor device, wherein the test data generating device and the at least one test data output are connected mutually; one test clock input and the at least one test data clock output are connected mutually; the first writing delay device is arranged inside the signal path between the test data generating device and the test data output, and / or inside the signal path between the test clock input and the test data clock output.

Description

Technical field [0001] The present invention relates to a semiconductor circuit device and relates to a system for testing a semiconductor device. Background technique [0002] It is known that semiconductor storage devices are tested with the help of test equipment. [0003] When testing semiconductor storage devices, in particular, the correctness of the interface timing is also checked, especially the so-called setup time and duration. However, if it is, for example, use Under the high frequency operation and test conditions of a semiconductor storage device with a clock frequency greater than 500MHz, it will be necessary to use it to generate such a high clock frequency with high accuracy, and it can also measure transients with high accuracy. The test equipment of time makes it more difficult to check the correctness of the interface timing. [0004] Figure 6 A configuration for testing a semiconductor storage device is shown. The semiconductor device 1 to be tested is pla...

AI Technical Summary

Problems solved by technology

[0009] However, the disadvantage of these devices is that their design is very complicated, and therefore, the production cost of these devices is relatively high

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