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Method of recording and/or reproducing temporary defect list, recording and/or reproducing apparatus, and write-once recording medium

A defect list, recording medium technology, applied in lighting and heating equipment, chemical instruments and methods, biochemical equipment and methods, etc., can solve the problems of small data volume, small TDMA, TDMA exhaustion, etc.

Active Publication Date: 2005-12-07
SAMSUNG ELECTRONICS CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, TDMA is smaller than the data area, and the amount of data that can be stored in TDMA is not large
Therefore, TDMA is quickly exhausted when defect management is performed on TDFL according to the prior art

Method used

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  • Method of recording and/or reproducing temporary defect list, recording and/or reproducing apparatus, and write-once recording medium
  • Method of recording and/or reproducing temporary defect list, recording and/or reproducing apparatus, and write-once recording medium
  • Method of recording and/or reproducing temporary defect list, recording and/or reproducing apparatus, and write-once recording medium

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Embodiment approach

[0053] Embodiments of the invention will now be described in detail, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like parts throughout. The embodiments are described below in order to explain the present invention by referring to the figures.

[0054] FIG. 1 shows the structure of a write-once recording medium 100 according to an embodiment of the present invention. The write-once recording medium 100 shown in FIG. 1 has a single recording layer including a lead-in area, a data area, and a lead-out area.

[0055] In the lead-in area, a disk management area 1 (DMA1), a disk management area 2 (DMA2), a main temporary disk management area (TDMA), a writing condition test area, and a drive information area are provided. In the data area, a spare area 1 and a spare area 2 for replacing a defective cluster generated in the user data area, a secondary TDMA, and a user data area are provided. In the lead-out area, a disk m...

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Abstract

A method of recording a temporary defect list on a write-once recording medium, a method of reproducing the temporary defect list, an apparatus for recording and / or reproducing the temporary defect list, and the write-once recording medium. The method of recording a temporary defect list for defect management on a write-once recording medium includes recording the temporary defect list, which is created while data is recorded on the write-once recording medium, in at least one cluster of the write-once recording medium, and verifying if a defect is generated in the at least one cluster. Then, the method includes re-recording data originally recorded in a defective cluster in another cluster, and recording pointer information, which indicates a location of the at least one cluster where the temporary defect list is recorded, on the write-once recording medium.

Description

technical field [0001] The present invention relates to a write-once recording medium, more specifically, to a method for recording a temporary defect list on a write-once recording medium, a method for reproducing a temporary defect list, a method for recording and / or Or a device for reproducing a temporary defect list, and a write-once recording medium. Background technique [0002] Defect management involves recording data already recorded on a position of a recording medium where a defect occurs when the data cannot be normally reproduced on another position of the recording medium, thereby preventing data loss caused by generation of a defect. [0003] Traditionally, defect management is classified into defect management using a linear replacement method and defect management using a sliding replacement method. The linear replacement method is to replace a defective data area with a spare area that does not have a defective data area. The ...

Claims

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Application Information

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IPC IPC(8): G11B7/007
CPCB09B3/00B09B5/00C12M27/06C12M29/06F26B3/18Y02W30/40B01F27/172
Inventor 黄盛凞高祯完
Owner SAMSUNG ELECTRONICS CO LTD
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