Directly connected interface unit for memory test machine and integrated circuit sorter

A technology for memory testing and integrated circuits, applied in electronic circuit testing, semiconductor/solid-state device testing/measurement, etc., can solve problems such as susceptibility to external noise interference, long paths, delays in integrated circuit pins, etc.

Inactive Publication Date: 2007-03-07
MACRONIX INT CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] Since the above-mentioned power supply and grounding of the integrated circuit under test are transmitted through the power line, they are susceptible to external noise interference, resulting in incorrect test results.
[0011] Moreover, the signal is transmitted through the coaxial isolated signal line, and the path it passes through is long, which can easily cause delays in the timing of the signal reaching the pins of the integrated circuit, making the test results incorrect

Method used

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  • Directly connected interface unit for memory test machine and integrated circuit sorter
  • Directly connected interface unit for memory test machine and integrated circuit sorter
  • Directly connected interface unit for memory test machine and integrated circuit sorter

Examples

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Embodiment Construction

[0041] Please refer to Fig. 4, Fig. 5 and Fig. 6 at the same time. Fig. 4 shows a side partial enlarged schematic diagram of the direct connection interface device connecting the memory tester and the integrated circuit classifier according to a preferred embodiment of the present invention, and Fig. 4 is a schematic diagram of Fig. 1 The partially enlarged schematic diagram of the circled part A, Figure 5 shows the direct connection interface device of the preferred embodiment of the present invention, the schematic diagram of the connection surface installed on the side of the integrated circuit sorter, and Figure 6 shows the preferred embodiment of the present invention The direct connection interface device of the embodiment is a schematic diagram of the connection surface installed on the side of the memory testing machine.

[0042] The direct connection interface device between the memory tester and the integrated circuit sorter in the preferred embodiment of the present ...

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Abstract

The directly connected interface unit for memory test machine and integrated circuit sorter includes main base board, printed circuit board, the first position aligning structure and the first fixing structure. The main base board has the second position aligning structure and the second fixing structure and is set on integrated circuit sorter. The main base board has upper edge lower than the feeding jog dial area and one opening to expose the distributor area. The printed circuit board is set on the memory test machine. The first position aligning structure set on the memory test machine is suitable for embedding with the second position aligning structure. The first fixing structure set on the memory test machine is suitable for connection with the second fixing structure in detachable mode.

Description

technical field [0001] The present invention relates to a direct mount interface device, and in particular to a direct mount interface device for a memory tester (Memory tester) and an integrated circuit sorter (IC handler). Background technique [0002] In the manufacturing process of integrated circuits, any mechanical equipment, process parameters, process environment and other factors not listed may have a negative impact on the integrated circuit process, resulting in manufacturing defects. However, for products supplied to consumers, the problem of such manufacturing defects can be minimized through prior testing and classification. [0003] In the method of testing and classifying integrated circuits, as shown in FIG. 1 , a memory testing machine 100 and an integrated circuit classifying machine 102 are connected to each other for testing and classifying integrated circuits. Generally speaking, the testing and sorting method is, for example, placing the integrated ci...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66G01R31/28
Inventor 杨伟源施光华陈金福
Owner MACRONIX INT CO LTD
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