Integrated circuit performance measurement and circuit experiment apparatus

Abstract

The experimental apparatus comprises following parts: base plate with multiple fixing holes and at least two fixing guide slots on its upper-surface, at least one a motherboard with printed circuit on it for IC chips and electronic components to be inserted, at least two fixing blocks inserted in the said fixed guide slots for fixing up the motherboard on the base plate between fixing guide slots, at least one fixing bar through the fixing holes installed on the base plate for fixing integral structure. Thus, motherboard can be combined on base plate flexibly and expediently. The invention can build measurement and experimental circuits from IC chips and electronic components safely, expediently and rapidly so as to provide functions for measuring and testing performances of IC circuits in various types and shapes (especially, paster type).

Description

technical field [0001] The invention relates to integrated circuit performance measurement and test technology, in particular to an integrated circuit performance measurement and circuit experiment device, which is suitable for integrated circuit performance measurement and design circuit experiments. Background technique [0002] In the design, debugging and maintenance of intelligent devices, it is often necessary to measure and test the combined performance of integrated circuits and certain circuits, so as to rationally deploy them, improve the performance of the entire system, and speed up the speed of research and development of new products. In the past, there were perforated boards, breadboards, and conductors under the holes, but the types suitable for integrated circuits were limited, and most of them were poor contacts and susceptible to interference. Chinese patent (patent No.: ZL90225066.3) discloses an "electronic circuit test bench". Its fixed feet are two-poi...

AI Technical Summary

Problems solved by technology

In the past, there were perforated boards, bread boards, and conductors under the holes, but the types suitable for integrated circuits were limited, and most of them were poor contacts and susceptible to interference.

Chinese patent (patent No.: ZL90225066.3) discloses an "electronic circuit test bench". Its fixed feet are two-point fixed structures. The category is single, the operation is cumbersome, and it is inconvenient to use

The conductor is a structure of copper pin plus soldering piece, terminal fork and wire. The disadvantages are: the structure is messy, the operation is complicated, it can only be used for electronic discrete components and simple in-line electronic components, and the electronic components on the copper pin and plug-in board The pins are in indirect contact, not close, poor reliability, large transfer resistance, weak anti-interference ability

As for the test board of the patch integrated block, it has not been seen in the market

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