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Bicrystal ultrasonic probe and automatic sensitivity detection method of flaw detection system thereof

An automatic detection and ultrasonic technology, which is applied in the use of sound waves/ultrasonic waves/infrasonic waves for material analysis, measuring devices, and greenhouse gas reduction. It can solve problems such as long detection time and difficult use, and achieve efficient probe self-inspection and save time. Effect

Pending Publication Date: 2022-07-08
NANJING TYCHO INFORMATION TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The pass-through flaw detection system has a large number of ultrasonic probes (hundreds or even more). If the above-mentioned traditional methods are used for the sensitivity detection of ultrasonic and flaw detection systems, the detection time will take a long time, and a limited skylight time needs to be applied for on-line detection.
[0004] Therefore, in this case, a fast, online-free, automatic detection method for dual-element ultrasonic probes and their flaw detection system sensitivity is needed to solve the daily use problems of the current pass-through flaw detection system.

Method used

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  • Bicrystal ultrasonic probe and automatic sensitivity detection method of flaw detection system thereof
  • Bicrystal ultrasonic probe and automatic sensitivity detection method of flaw detection system thereof
  • Bicrystal ultrasonic probe and automatic sensitivity detection method of flaw detection system thereof

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Experimental program
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Effect test

Embodiment 1

[0037] The working process of the sensitivity automatic detection method of the dual crystal ultrasonic probe and the flaw detection system of the present embodiment is as follows: Image 6 shown:

[0038] Step 1: Utilize artificial standard defects of standard test blocks (such as Flat-bottomed hole, the specific defect depends on the flaw detection standard), test the sensitivity of the dual-crystal ultrasonic probe and its flaw detection system, record the sensitivity amplitude (wave height amplitude) at this time as H1 (set as the reference value), record the current Probe gain value S1 (set as reference value).

[0039] Step 2: Use the emitter 6 of the dual-crystal ultrasonic probe 14 to transmit ultrasonic waves (the echo line of the echo pole 12 is disconnected at this time). Due to the existence of the organic glass of the emitter 6 itself, an interface wave (such as image 3 shown), the emitter 6 receives the interface wave through a special circuit, at this time t...

Embodiment 2

[0050] using as Figure 5 The shown emitter and echo pole are connected in parallel to form a transmit echo pole, and a method for automatic detection of the sensitivity of the dual-crystal ultrasonic probe and its flaw detection system is performed.

[0051] Step 1: Utilize artificial standard defects of standard test blocks (such as Flat-bottomed hole, the specific defect depends on the flaw detection standard), test the sensitivity of the dual-crystal ultrasonic probe and its flaw detection system, record the sensitivity amplitude (wave height amplitude) at this time as H1 (set as the reference value), record the current Probe gain value S1 (set as reference value).

[0052] Step 2: Use the transmitting echo pole of the dual-crystal ultrasonic probe 14 to transmit ultrasonic waves. Due to the existence of the organic glass of the transmitting echo pole itself, an interface wave (such as Figure 5 shown), the transmitting echo pole receives the interface wave through a sp...

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Abstract

The invention discloses a bicrystal ultrasonic probe and an automatic sensitivity detection method of a flaw detection system of the bicrystal ultrasonic probe. The automatic sensitivity detection method does not need to use a standard test block; the emitting electrode and the echo electrode of the bicrystal ultrasonic probe emit and receive interface waves independently, the wafer of the emitting electrode or the echo electrode generates ultrasonic waves, the end face of the bicrystal ultrasonic probe emits the ultrasonic waves to form the interface waves, and the interface waves are received by the wafer generating the ultrasonic waves; or the emitting electrode and the echo electrode of the bicrystal ultrasonic probe are connected in parallel to form an emitting echo electrode; the wafer of the transmitting echo pole generates ultrasonic waves, the end face of the twin-crystal ultrasonic probe transmits the ultrasonic waves to form interface waves, and the interface waves are received by the wafer of the transmitting echo pole. According to the invention, the sensitivity of the twin-crystal ultrasonic probe and the flaw detection system thereof can be rapidly and automatically detected in a short time without a standard test block.

Description

technical field [0001] The invention belongs to the field of ultrasonic non-destructive testing, in particular to a dual-crystal ultrasonic probe (also called an ultrasonic transducer) and an automatic detection method for the sensitivity of a flaw detection system. Background technique [0002] The sensitivity of the existing traditional dual-element ultrasonic probes requires the use of standard test blocks for sensitivity measurement (such as figure 2 ), this method is suitable for the sensitivity detection of a small number of dual-crystal ultrasonic probes in the room, and there are ready-made and mature standards and methods: the dual-crystal ultrasonic probe works in the one-transmit-one-receive mode, and the right transmitting chip emits ultrasonic waves through the wedge. When the test block reaches the artificial standard defect position, the ultrasonic reflection is transmitted to the left receiving wafer, and the defect of the artificial standard test block can b...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N29/30
CPCG01N29/30Y02E30/30
Inventor 郭其昌梅劲松张兆贵李加杰高乐汪项超邵永发黄立松李佳岭卞志豪
Owner NANJING TYCHO INFORMATION TECH
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