Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Method and device for detecting micron-level defects of small-caliber inner wall and application

A defect detection, small-caliber technology, applied in measuring devices, reducing greenhouse gases, instruments, etc., to achieve the effects of improving detection efficiency, saving personnel costs, and improving production efficiency

Active Publication Date: 2022-03-01
TIANJIN UNIV
View PDF7 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

It specifically relates to a method for detecting micron-level defects on the inner wall of a small aperture

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method and device for detecting micron-level defects of small-caliber inner wall and application
  • Method and device for detecting micron-level defects of small-caliber inner wall and application
  • Method and device for detecting micron-level defects of small-caliber inner wall and application

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0061] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific implementations disclosed below.

[0062] The technical solutions of the present invention will be further described below in conjunction with specific embodiments and accompanying drawings.

[0063] Such as Figure 1-Figure 2 As shown, the machine vision-based detection device for micron-scale surface defects on the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to a surface defect detection technology of a cylindrical inner wall to be detected, and discloses a small-caliber inner wall micron-level defect detection method, a detection device and application of the small-caliber inner wall micron-level defect detection method. A visual environment is built according to the size of an inner wall to be detected, a stripe light source is placed at the bottom of the inner wall to be detected, a CCD camera obtains an inner wall image of the stripe light source in the inner wall from the other end, and when the inner wall has defects, defect images at the corresponding positions deflect; by designing a stripe shape, a mechanical structure and a CCD (Charge Coupled Device) camera image processing method, online detection of micron-sized defects of the inner wall of the small caliber is realized on a deflected defect image based on a ray tracing method. According to the invention, high-efficiency detection can be carried out, the problem of slow rhythm of existing equipment is solved, and the detection efficiency is improved by dozens of times on the original basis. According to the invention, high-precision on-line detection of small-diameter inner wall defects by enterprises is realized, and the production efficiency is improved.

Description

technical field [0001] The invention belongs to the surface defect detection technology of the cylindrical inner wall to be tested, specifically belongs to the technical field of micron-level defect detection technology of the small-diameter inner wall surface, and in particular relates to a machine vision-based micron-level defect detection device and method of the small-diameter inner wall. Background technique [0002] At present, the global industrialization level, high-end manufacturing and other fields have developed rapidly. The mechanical structure and functions of various industrial equipment are developing towards diversification and complexity. More and more cylindrical workpieces are used in machinery, automobiles, aerospace, It is processed and used in modern high-end manufacturing fields such as the military. Common applications include automobile engine cylinders and bushings, eddy current transformers, hydraulic torque converters, and drums of aero engines. Sl...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/954G01N21/01
CPCG01N21/954G01N21/8851G01N21/01G01N2021/8887G01N2021/0112Y02E30/30
Inventor 袁帅鹏张效栋闫宁朱琳琳
Owner TIANJIN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products