Quantum chip testing method, device and system and storage medium

A chip testing and sub-chip technology, applied in the field of quantum measurement and control, can solve the problems of manual misoperation, poor error, low test efficiency, etc.

Active Publication Date: 2022-02-18
HEFEI ORIGIN QUANTUM COMP TECH CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] The main purpose of the present invention is to provide a quantum chip testing method, device, system and storage medium, aiming to solve the technical problem that the existing quantum chip testing is not only low in test efficiency but also prone to errors due to manual misoperation

Method used

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  • Quantum chip testing method, device and system and storage medium
  • Quantum chip testing method, device and system and storage medium
  • Quantum chip testing method, device and system and storage medium

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Embodiment Construction

[0038]In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It should be understood that the appended The figures are only for the purpose of illustration and description, and are not used to limit the protection scope of the present application.

[0039] Additionally, it should be understood that the schematic drawings are not drawn to scale. The flowcharts used in this application illustrate operations implemented in accordance with some of the embodiments of this application. It should be understood that the operations of the flowcharts may be performed out of order, and steps that have no logical context may be performed in reverse order or concurrently. In addition, those skilled in the art may add one or more ot...

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Abstract

The invention provides a quantum chip test method, device and system and a storage medium. The method comprises the steps of carrying out uploading and configuration of a manual parameter configuration process in a conventional technology in a test tool kit form, combining the environment configuration data, quantum chip test data and a target test process in the test tool kit through a quantum measurement and control module, automatically generating a corresponding pulse test signal, and completing the whole chip test process. The test efficiency is further effectively improved, the method is convenient to adapt to complex test conditions, wrong test results generated due to manual misoperation under the complex test conditions can be avoided, and the technical problems that existing quantum chip testing is low in testing efficiency, and errors are likely to occur due to manual misoperation are solved.

Description

technical field [0001] The present application relates to the technical field of quantum measurement and control, in particular, to a quantum chip testing method, device, system and storage medium. Background technique [0002] During the parameter testing process of the quantum chip, the tester usually performs the test after manually configuring the test parameters. In the traditional solution, testers usually need to manually frequently set various test parameters of the quantum measurement and control instrument before performing manual measurements, and frequently collect the measurement data of each test process before analyzing the test results. This method is not only time-consuming and labor-intensive, but also affects test efficiency, and in complex test situations, it is easy to produce wrong test results due to manual misoperation. Contents of the invention [0003] The main purpose of the present invention is to provide a quantum chip testing method, device, ...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R31/311
CPCG01R31/2851G01R31/311Y02D10/00
Inventor 石汉卿张昂孔伟成
Owner HEFEI ORIGIN QUANTUM COMP TECH CO LTD
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