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Thin material thickness measuring method

A measurement method and thin material technology, applied in the direction of measuring devices, instruments, optical devices, etc., can solve the problem of low measurement accuracy of thin materials, achieve simple methods, high-precision measurement, and overcome low measurement accuracy

Pending Publication Date: 2022-02-11
SHENZHEN MANST TECH CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0004] Therefore, the technical problem to be solved by the present invention is that the measurement accuracy of the thin material in the prior art is not high, so as to provide a method for measuring the thickness of the thin material

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Embodiment Construction

[0032] The technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Apparently, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0033] In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer" etc. The indicated orientation or positional relationship is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, ...

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Abstract

The invention relates to the technical field of thin material production, in particular to a thin material thickness measuring method. The thin material thickness measuring method comprises the following steps: performing grid division on the peripheral surfaces of a reference piece and a thin material to be measured, measuring a first distance between each first grid of the reference piece and a distance measuring structure, and storing the first position and the first distance of the first grid; enabling the thin material to be measured to bypass the circumferential surface of the rotating reference piece, measuring a second distance between any second grid of the thin material to be measured and the distance measuring structure, and storing a second position and the second distance of the second grid; acquiring the first position corresponding to the second position and the first distance, wherein the difference between the second distance and the first distance is the thickness of the thin material to be measured, and the first grids on the peripheral surface of the reference piece are in one-to-one correspondence with the second grids of the thin material to be measured. According to the thin material thickness measuring method, the defect that the measuring precision is not high due to the fact that tolerance exists in the manufacturing process of the reference part is overcome, and the thin material thickness measuring method is provided.

Description

technical field [0001] The invention relates to the technical field of thin material production, in particular to a method for measuring the thickness of thin material. Background technique [0002] In order to meet the market demand, a large number of products whose length is much larger than the thickness have appeared in the production of manufacturers. However, due to the small thickness of this product, it is difficult to meet its accuracy requirements by conventional measurement methods. Therefore, thickness measurement of thin materials has become a difficult problem in the production of enterprises. [0003] At present, in the field of thickness measurement, two upper and lower laser thickness gauges are installed at the same position of the thin material, and the thickness of the measured thin material is obtained by comparing with the calibration block or the calibration diaphragm. This measurement method requires the thin material to be suspended in the air, and t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/06
CPCG01B11/06
Inventor 彭建林李宁杨香武
Owner SHENZHEN MANST TECH CO LTD
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