Three-dimensional measurement system for surface of reflective object, measurement method and storage medium thereof

A technology for object surface, three-dimensional measurement, applied in measurement devices, optical devices, instruments, etc., can solve the problems of small measurement range of deflection system, and achieve the effect of increasing complexity, improving efficiency, and strong universality

Active Publication Date: 2022-07-19
HEBERSON TECH (SHENZHEN) CO LTD
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The main technical problem to be solved in this application is the small measurement range of the deflection system for three-dimensional measurement of the surface of reflective objects

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Three-dimensional measurement system for surface of reflective object, measurement method and storage medium thereof
  • Three-dimensional measurement system for surface of reflective object, measurement method and storage medium thereof
  • Three-dimensional measurement system for surface of reflective object, measurement method and storage medium thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0072] See figure 2 , figure 2 A schematic flowchart of a method for three-dimensional measurement of the surface of a reflective object provided in an embodiment of the present application, the method in this embodiment is performed by an electronic device, and the electronic device may be the above-mentioned figure 1 Processing device 4 in the system shown. The first camera in this embodiment may be the above figure 1 The first camera 2 shown, the second camera can be the above figure 1 The second camera 3 shown, the fringe image can be as above figure 1 The fringe image produced by the display device 1 shown. The method provided by this embodiment includes the following steps:

[0073] S201: Acquire a first image and a second image.

[0074] Wherein, the first image is the image of the object to be tested captured by the first camera, the second image is the image of the object to be tested captured by the second camera, and both the first image and the second image...

Embodiment 2

[0169] This embodiment provides a three-dimensional measurement system for the surface of a reflective object, including:

[0170] Display screen for displaying fringe images;

[0171] a first camera, used for capturing a first image of the fringe image reflected by the surface of the object to be measured, and sending the first image to the processor;

[0172] The second camera is used to capture the second image of the fringe image reflected on the surface of the object to be measured, and send the second image to the processor; the fields of view of the first camera and the second camera have overlapping areas, and when the object to be measured is measured, The object to be tested is at least partially in the overlapping area;

[0173] a processor, configured to obtain a height value and a gradient value of a first object point according to the first image and the second image, where the first object point is an object point in the overlapping area of ​​the field of view ...

Embodiment 3

[0183] An embodiment of the present application provides a computer-readable storage medium, where a program is stored on the medium, and the program can be executed by a processor to implement the method in the foregoing first embodiment.

[0184] Those skilled in the art can understand that all or part of the functions of the various methods in the foregoing embodiments may be implemented by means of hardware or by means of computer programs. When all or part of the functions in the above-mentioned embodiments are implemented by means of a computer program, the program may be stored in a computer-readable storage medium, and the storage medium may include: read-only memory, random access memory, magnetic disk, optical disk, hard disk, etc. The computer executes the program to realize the above-mentioned functions. For example, the program is stored in the memory of the device, and when the program in the memory is executed by the processor, all or part of the above functions...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

A three-dimensional measurement system for the surface of a reflective object, a measurement method and a storage medium thereof. By acquiring the first image of the object to be tested captured by the first camera and the second image of the object to be tested captured by the second camera, the first image and the second image contain fringe images reflected on the surface of the object to be tested; according to the first image and the second image to obtain the height value and gradient value of the first object point, the first object point is the object point in the overlapping area of ​​the field of view of the first camera and the second camera; determine the first height value of the second object point The initial value is the height value of the first object point, the second object point is in the adjacent area of ​​the first object point, and the second object point is in the non-overlapping area of ​​the field of view of the first camera and the second camera; based on the second object point The initial value of the first height value of the object point and the preset step size are iteratively processed to determine the gradient value of the second object point; according to the gradient values ​​of all object points, the surface of the object to be measured is reconstructed, and the shape of the object to be measured is obtained. appearance data. Thus expanding the measurement range.

Description

technical field [0001] The present application relates to the technical field of object surface measurement, in particular to a three-dimensional measurement system for the surface of a reflective object, a measurement method and a storage medium thereof. Background technique [0002] Reflective objects, such as mirror or mirror-like objects, need to be precisely measured, so as to realize three-dimensional reconstruction of the surface of the reflective object or detection of surface defects. [0003] Traditionally, a single-camera deflection system is used to measure highly reflective objects. However, due to the influence of "non-unique normal direction", the traditional measurement conditions are relatively harsh. In order to solve this problem of the traditional single-camera deflection system, the deflection system based on the principle of normal direction consistency of two cameras is now mostly used. [0004] However, this deflection system has a small measurement ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24
CPCG01B11/24
Inventor 吴伟锋王国安王明毅陈晓铭彭粤龙
Owner HEBERSON TECH (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap