Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Crop yield estimation method based on multi-source data

A multi-source data and crop technology, applied in the fields of precision agriculture and agricultural informatization, can solve the problems of inaccurate plot scale and limitations, and achieve the effect of improving accuracy and precision

Pending Publication Date: 2021-11-02
杭州领见数字农业科技有限公司
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the predecessors mostly started from a single phase of yield formation and established crop yield estimation models. The yield estimation models that comprehensively consider the characteristics of the crop itself and the impact of the growth environment are rarely mentioned. At the same time, the results of yield estimation based on statistical survey data are mostly limited to administrative unit, not accurate to the parcel scale

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Crop yield estimation method based on multi-source data
  • Crop yield estimation method based on multi-source data
  • Crop yield estimation method based on multi-source data

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0059] like figure 1 As shown, a crop yield estimation method based on multi-source data includes the following steps:

[0060] S110. Acquiring multiple historical yield impact indices per mu and multiple historical yield change indicators of crops to be estimated;

[0061] S120. According to the least squares method, perform regression analysis with the multiple historical yield impact indices as independent variables and the multiple historical yield change indicators as dependent variables, to obtain multiple regression equations;

[0062] S130. Obtain multiple yield impact indices of the target production estimation year, and calculate multiple mu yield change indicators of the target production estimation year in combination with the multiple regression equations;

[0063] S140. Input the plurality of yield change indicators per mu into a pre-established yield estimation model to predict the yield of the crop to be estimated.

[0064] According to Example 1, it can be s...

Embodiment 2

[0066] like figure 2 As shown, a crop yield estimation method based on multi-source data, including:

[0067] S210. Obtain multi-source remote sensing image data and multiple historical yield change indicators of the crops to be estimated after preprocessing, the preprocessing includes geometric correction and resampling;

[0068] S220. Obtain multiple impact index calculation formulas, and combine the processed remote sensing image data to calculate multiple historical yield impact indices per mu of the crop to be estimated.

[0069] S230. According to the least square method, perform regression analysis with the plurality of historical yield impact indices as independent variables and the plurality of historical yield change indicators as dependent variables respectively, to obtain multiple regression equations;

[0070] S240. Obtain multiple yield impact indices of the target production estimation year, and calculate multiple mu yield change indicators of the target produ...

Embodiment 3

[0075] like image 3 As shown, a crop yield estimation method based on multi-source data, including:

[0076] S310. Obtain multiple historical yield impact indices per mu and multiple historical yield change indicators of crops to be estimated;

[0077] S320. According to the least squares method, perform regression analysis with the multiple historical yield impact indices as independent variables and the multiple historical yield change indicators as dependent variables, to obtain multiple regression equations;

[0078] S330. Obtain multiple yield impact indices of the target production estimation year, and calculate multiple mu yield change indicators of the target production estimation year in combination with the multiple regression equations;

[0079] S340. Obtain the historical yield data of the crop to be estimated, and calculate the yield correction value of the crop to be estimated according to the deviation of the historical yield data;

[0080] S350. Construct a ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a crop yield estimation method based on multi-source data. The crop yield estimation method comprises the following steps: acquiring a plurality of historical yield influence indexes per mu and a plurality of historical yield change indexes per mu of crops to be estimated; according to a least square method, carrying out regression analysis by taking the plurality of historical per mu yield influence indexes as independent variables and the plurality of historical per mu yield change indexes as dependent variables to obtain a plurality of regression equations; obtaining a plurality of yield influence indexes of a target yield estimation year, and calculating a plurality of per mu yield change indexes of the target yield estimation year in combination with the plurality of regression equations; and inputting the multiple acre yield change indexes into a pre-established yield estimation model, and predicting the yield of the crop to be estimated. According to the scheme, the crop growth environment and growth characteristics are comprehensively considered, the crop phenological period of the specific area is combined, the crop yield estimation model containing the standard yield per mu and the yield change amount is constructed, the influence of the environment can be considered in the yield change amount, the yield estimation result can be dynamically adjusted, and the crop yield estimation precision is improved.

Description

technical field [0001] The invention relates to the fields of precision agriculture and agricultural informatization, in particular to a crop yield estimation method based on multi-source data. Background technique [0002] As an important economic crop and one of the agricultural products for international trade, crops have become the pillar industry of the agricultural economy in the vast areas of southern my country. With the research and application of agricultural information technology, traditional agriculture is gradually transforming into information agriculture and scientific agriculture. Its characteristics of large-scale simultaneous observation play an increasingly important role in the transformation of scientific and technological agriculture. Different from previous crop yield estimation methods, remote sensing technology provides a new scientific method for comprehensive, macroscopic, rapid and dynamic observation of crops. technical means. [0003] At present...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06K9/00G06K9/62G06N20/00
CPCG06N20/00G06F18/241
Inventor 周祖煜王俊霞余敏陈煜人李天齐
Owner 杭州领见数字农业科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com