Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Image classification method, system and electronic device based on dual attention mechanism

A classification method and attention technology, applied in the field of image processing, can solve the problems that local features cannot be well guaranteed to have similar feature expressions, restrict accurate expression, weak correlation, etc., and achieve efficient weight adaptive allocation, accurate and robust. Rod image feature expression, the effect of improving image classification performance

Active Publication Date: 2021-11-02
WUHAN UNIV
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] (2) Limitations of convolution mode
The essence of the convolution operation is to use a single sampling mode to filter a specific area. Although the deep convolutional network can realize the feature expression in the large-scale receptive field through multi-layer and multi-modal convolution operations, the singleness and adjacency of the sampling mode This limitation restricts the accurate expression of features of different scales by the convolutional network, and also leads to the weak correlation of the local representation of the final generated features at the overall image level, which cannot ensure that the local features with similar semantic content of the image have similar feature expression
[0005] (3) The classification recognition degree between the feature map channels is different

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Image classification method, system and electronic device based on dual attention mechanism
  • Image classification method, system and electronic device based on dual attention mechanism
  • Image classification method, system and electronic device based on dual attention mechanism

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] In order to facilitate those of ordinary skill in the art to understand and implement the present invention, the present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the implementation examples described here are only used to illustrate and explain the present invention, and are not intended to limit this invention.

[0033] please see figure 1 , a kind of image classification method based on double attention mechanism provided by the invention, comprises the following steps:

[0034] Step 1: Build a Transformer-based spatial dimension self-attention network and a Transformer-based feature map channel dimension self-attention network;

[0035] please see figure 2 , the Transformer-based spatial dimension self-attention network of this embodiment, the first layer is 3 parallel convolution kernels is a convolution operation with a step size of 1 × 1, the second layer is t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses an image classification method, system and electronic equipment based on a dual attention mechanism. Using an improved self-attention model, the attention weights of the feature map space dimension and the feature map channel dimension are simultaneously calculated, and then the two kinds of attention The feature maps generated by the force mechanism are added together to complete the end-to-end image classification network construction, improve the network's adaptive perception of salient areas, achieve more accurate and robust image feature expression, and then improve image classification performance.

Description

technical field [0001] The invention belongs to the technical field of image processing, and relates to an image classification method, system and electronic equipment, in particular to an image classification method, system and electronic equipment based on a dual attention mechanism. Background technique [0002] Since the birth of deep learning, related technologies, especially those related to deep convolutional networks, have brought great changes and influences to the field of computer vision. The image classification method based on deep convolutional networks has become the mainstream method of current research. However, this method also has the following disadvantages: [0003] (1) Excessive reliance on training data. Image feature expression is the core content of image classification methods based on deep convolutional networks, and accurate and robust feature acquisition largely depends on the network's learning of massive data. The quantity and quality of data ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/62G06N3/04G06N3/08
CPCG06N3/084G06N3/045G06F18/24G06F18/214
Inventor 何政叶刚傅佑铭王中元邹勤
Owner WUHAN UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products