Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Intelligent sample preparation system, method and electronic equipment for cryo-electron microscope

A preparation system and cryo-electron microscope technology, applied in the field of scanning electron microscope, can solve the problems of poor sample cross-section quality and low position accuracy, etc.

Active Publication Date: 2021-09-10
INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
View PDF6 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the above problems, that is, in order to solve the problems of poor sample cross-section quality and low position accuracy of existing cryo-electron microscope sample preparation devices, the present invention provides a system, method and electronic equipment for intelligent preparation of cryo-electron microscope samples

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Intelligent sample preparation system, method and electronic equipment for cryo-electron microscope
  • Intelligent sample preparation system, method and electronic equipment for cryo-electron microscope
  • Intelligent sample preparation system, method and electronic equipment for cryo-electron microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0069] In order to make the embodiments, technical solutions and advantages of the present invention more obvious, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Example. Those skilled in the art should understand that these embodiments are only used to explain the technical principles of the present invention, and are not intended to limit the protection scope of the present invention.

[0070]The first aspect of the present invention provides an intelligent sample preparation system for cryo-electron microscopy, the system includes a general control center, an ultra-low temperature liquid pool, a sample holding mechanism, a sample processing mechanism, a position adjustment mechanism and a sample transfer mechanism, an ultra-low temperature liquid pool, a sample The holding ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention belongs to the technical field of scanning electron microscopy, and specifically relates to a system, method and electronic equipment for intelligent preparation of cryo-electron microscope samples, aiming to solve the problems of poor section quality and low position accuracy of existing cryo-electron microscope sample preparation devices; Center, ultra-low temperature liquid pool, sample holding mechanism for limiting the position of samples to be processed, sample processing mechanism for cutting / polishing samples, position adjustment mechanism, and sample transfer mechanism for transferring processed samples; during the work process, the total The control center controls the ultra-low temperature liquid pool based on the target sample type to provide a preset temperature environment, and starts the position adjustment mechanism based on the position information of the sample holding mechanism in the first chamber to drive the sample processing mechanism to process according to the preset processing route. The processed sample information in the second chamber activates the sample transfer mechanism to transfer the preset environment; the invention can realize high-quality and high-precision cryo-electron microscope sample preparation.

Description

technical field [0001] The invention belongs to the technical field of scanning electron microscopes, and in particular relates to an intelligent preparation system, method and electronic equipment for cryo-electron microscope samples. Background technique [0002] The cryo-cutting and polishing device is a device for cutting and polishing samples in a low-temperature freezing environment, and is suitable as a pre-treatment device for observing the surface of samples with a cryo-scanning electron microscope. [0003] The sample room of the conventional scanning electron microscope is a high vacuum environment, which requires the observation sample to be dry and non-volatile. However, many samples contain water, oil or are volatile, so they cannot meet the conditions of the conventional electron microscope. At the same time, the loss of water and oil will also cause sample structure, The nature changes and the test data is distorted. The cryo-scanning electron microscope dev...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/2202
CPCG01N23/2202G01N1/32G01N2001/2873G01N1/42G01N2223/3103H01J37/185
Inventor 杜忠明杨继进董文杰
Owner INST OF GEOLOGY & GEOPHYSICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com