Intelligent preparation system and method for cryoelectron microscope sample and electronic equipment

Abstract

The invention belongs to the technical field of scanning electron microscopes, particularly relates to an intelligent preparation system and method for a cryoelectron microscope sample and electronic equipment, and aims at solving the problems that an existing cryoelectron microscope sample preparation device is poor in cross section quality and low in position precision. The system comprises a master control center, an ultralow-temperature liquid pool, a sample holding mechanism for limiting a to-be-processed sample, a sample processing mechanism for cutting / polishing the sample, a position adjusting mechanism and a sample transferring mechanism for transferring the processed sample, in the working process, the general control center controls the ultralow-temperature liquid pool to provide a preset temperature environment based on the type of a target sample, and starts the position adjusting mechanism based on the position information of the sample keeping mechanism in the first cavity to drive the sample processing mechanism to carry out processing according to a preset processing route; a sample transfer mechanism is started to transfer in a preset environment based on the information of the processed sample transferred into the second chamber; and according to the invention, high-quality and high-precision cryoelectron microscope sample preparation can be realized.

Description

technical field [0001] The invention belongs to the technical field of scanning electron microscopes, and in particular relates to an intelligent preparation system, method and electronic equipment for cryo-electron microscope samples. Background technique [0002] The cryo-cutting and polishing device is a device for cutting and polishing samples in a low-temperature freezing environment, and is suitable as a pre-treatment device for observing the surface of samples with a cryo-scanning electron microscope. [0003] The sample room of the conventional scanning electron microscope is a high vacuum environment, which requires the observation sample to be dry and non-volatile. However, many samples contain water, oil or are volatile, so they cannot meet the conditions of the conventional electron microscope. At the same time, the loss of water and oil will also cause sample structure, The nature changes and the test data is distorted. The cryo-scanning electron microscope dev...

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Problems solved by technology

[0004] In order to solve the above problems, that is, in order to solve the problems of poor sample cross-section quality and low position accuracy of existing cryo-electron microscope sample preparation devices, the present invention provides a system, method and electronic equipment for intelligent preparation of cryo-electron microscope samples

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